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Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Indoor Multi-Light source of Measurement System for PV Cell
King Design Industrial Co., Ltd.
The multi-light source measurement system is capable of execute I-V measurements by Real-Time One-Sweep Method (RTOSM), which not only removes the capacity effect but also meets the requirements of SEMI PV57-1214. The measurement process is controlled by designed program, thus the measured I-V curve, Pmax/Isc/Voc/… etc, could be exported automatically.This system is applicable to DSSC/OPV/Perovskite measurements.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Hydraulic Universal Testing Machines
UH-X/FX Series
Environmentally and operator friendly state-of-the-art universal testing machine The operability and visibility of the computer-controlled hydraulic servo type universal testing machine (UH-X) and the high-performance universal testing machine (UH-FX), equipped with front opening type hydraulic grips, have been greatly improved by the adoption of a large color touch panel. Equipped with a semi autotuning function that automatically adjusts the control parameters, stress control and strain control (ISO 6892 compliant) can be easily carried out without the need for a preliminary test. The UH-Xh and UH-FXh models feature a new hybrid hydraulic oil source that reduces the required quantity of hydraulic oil, thereby achieving a major reduction in electrical power (about 50 %).
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EasyMatrixCode
Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
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Optical Transceiver
RJ-11
The next generation of optical transceiver has arrived with the introduction of GCI's RJ-11 Optical Transceiver. This fully SEMI compliant and Hokuyo compatible unit is the choice of leading 300mm FABs and equipment manufacturers throughout the world to simplify installation and maintenance of their E84 communications.
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Trace Moisture Analyzer
PPM1
Model PPM1 is a trace moisture analyzer designed specifically for monitoring moisture levels in dew point and PPM units. This trace moisture analyzer utilizes an electro-chemical (P205) sensor in combination with a proprietary semi permeable diffusion membrane.
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Easy E23 / E84
Objective Solutions' Easy E23/E84 product line is designed to simplify the integration of SEMI E84 and E23 into Process Equipment and Factory Vehicle systems. The models provide a standard E23/E84 infrared interface to AGV/OHV and process equipment, utilizing Hokuyo transceivers. The Easy E23/E84 units have been developed to work as-is with Hokuyo IR transceivers and as an option, with opti-isolation as required by direct-connect applications. They enable simple integration to process equipment or AGV application programs.
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Control & Automation Solutions
Produce a consistently high-quality product with a control system that’s easy to integrate into any process, simple or complex. Probat control systems feature clearly designed user interfaces and the ability to store and export production data as needed. Available as both semi- and fully automatic systems, our control systems enhance the performance of our commercial coffee roasters and grinders to yield superior results.
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Flexible Waveguide
Flann offers a number of solutions for flexible waveguide interconnect including waveguide-coaxial-waveguide and semi rigid. Traditional flexible waveguide solutions are available on request.
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Compliance Testing Services
Compatible Electronics is the largest commercial compliance test lab in Southern California, with four test locations, 10 Open Area Test Sites (OATS) and 7 Semi Anechoic Facilities. All open field sites (OATS) are in low ambient areas, which is ideal for radiated emissions testing.
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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High Power LED Photo-color-semi Automatic Selector
Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Semi-Portable Gas And Leak Detectors
Semi Portable Gas Detectors and Leak Detectors meet the diverse requirements for gas detection industries throughout the world. Our range offers an ideal solution where a temporary detection or contractual detection is required for a specific project or incident.
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PI/O Optical Transceiver
GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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10W to 100W - Single Output
DRL Series
*High Efficiency, up to 90%*Low Profile for Building Automation*Class II Double Insulation*ErP Compliant Design*Low No Load Power Consumption*UL 1310 Class 2 Compliant*SEMI F47 Compliant
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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300W to 1800W - Single Output
HWS Series
*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*High Efficiency*Class 1 Div 2 option (/RY suffix)
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Customization & Automation
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Machine Vision Camera - 1.3 MP, 60 FPS, e2v EV76C560, Color
Flea3 USB3
The Flea®3 line of USB3 Vision, GigE Vision and FireWire cameras offers a variety of CMOS and CCD image sensors in a compact package. The Flea3 leverages a variety of Sony, ON Semi, and e2v sensors ranging from 0.3 MP to 5.0 MP and from 8 FPS to 120 FPS. For FLIR GigE and USB3 cameras with the latest sensors and most advanced feature sets, please refer to our Blackfly S and Oryx camera families.
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Sapphire 3D Microscope
WDI-2000
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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500W to 1500W - Single Output
LZSA Series
*Five year warranty*-40°C to +71°C Operation*MIL-STD-810E Vibration / Shock*Input transient protected*UL508, SEMI F47, Factory Mutual (Cl 1, Div 2)*Rugged design with conformal coating*Superior thermal design
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600W to 1056W - Single Output
SWS-L Series
*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Electric Burn-in Board Carts
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Semi- or Fully-Automatic Laser Repair System
LCD 6400
The Korima Model 6400-L offers an exceptional laser cutting system that exceeds the requirements for flat panel display, large photomask, and color filter repair. Fully automatic and remote controlled, the 6400-L comes with single, dual, or triple wavelength to achieve optimum results in the removal of aluminum, chromium, ITO, and polymide on panels before or after assembly.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
