Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Semi-Portable Gas And Leak Detectors
Semi Portable Gas Detectors and Leak Detectors meet the diverse requirements for gas detection industries throughout the world. Our range offers an ideal solution where a temporary detection or contractual detection is required for a specific project or incident.
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Electric Burn-in Board Carts
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Mobii Media Encoder
The Smart Encoder is designed for semi and permanent based on-site installation. Deployed into sport stadiums/arena’s, Broadcast production sites, Data Centers and Outside Broadcast vehicles, the Smart Encoder will ingest a variety of input video sources such as SDI, NDI, SRT, MPEG-TS. The encoder will ingest, synchronize, encode and upload Microblock streams to the nearest cloud regional edge cluster for global distribution via the Co-Ordinator, or output a variety of streaming formats to local network for on-site usage.
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Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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Semi-automatic Single Phase Close Link kWh Meter Test Bench
SY8120
Hong Kong Songyang Industrial Ltd.
The SY8120 new series semi-automatic single phase energy meter test board, designed according to International Standard, is newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
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PXI Semi-Dynamic Digital I/O Module, 16-Channel
40-419-004
The 40-419-004 is a 16-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Optical Transceiver
RJ-11
The next generation of optical transceiver has arrived with the introduction of GCI's RJ-11 Optical Transceiver. This fully SEMI compliant and Hokuyo compatible unit is the choice of leading 300mm FABs and equipment manufacturers throughout the world to simplify installation and maintenance of their E84 communications.
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Customization & Automation
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
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MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
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Ultrasonic Clamp-On Flow Sensor
SEMIFLOW CO.65
SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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PXI Semi-Dynamic Digital I/O Module, 48-Channel
40-419-002
The 40-419-002 is a 48-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
