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Bit Error Rate Testers
Bit Error Rate Testers measure data integrity and express the ratio of received bits that are in error relative to the amount of bits received. AKA: BERT
See Also: BER Testers, BERT
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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4/8 Channel 20.0 ~ 56.0 Gb/s PAM4 Bit Error Rate Tester
CA9810
The UC INSTRUEMNTS CA9810 4/8 Channel 20.0 ~ 56.0 Gb/s PAM4 Bit Error Rate Tester is a high performance, flexible and cost effective four/eight channel PAM4 Bit Error Rate tester that can operate from 20.0 Gb/s to 56.0 Gb/s each Channel. 4/8 channel 56.0 Gb/s make it total up to over more than 240/480 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-01
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Economical Solution for Test Requiring Fewer Instrumentation Modules.
OPTOWARE-S200 (FOTS-Bench Top Series)
•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Electrical and Optical & Bit-Error-Rate Testers (BERTs)
OptoBERT™
The OptoBERT family of BERTs offers the best value in the industry for bit-error-ratio testing of optical and electrical components, subsystems and systems. OptoBERT family of products covers data rates from 100 Mb/s to 28.05 Gb/s.
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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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120 GBd High-performance BERT
M8050A
The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. With uncompromised signal integrity, support for NRZ, PAM4, PAM6, and PAM8 signals, and data rates up to 120 GBd, the flexible architecture of the M8050A supports 1.6T pathfinding as well as other leading-edge technologies.
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Personal SerDes Testers
C Series
Everything you need to develop and verify your high-speed digital algorithms is contained in these ultra-portable test instruments. They will forever change the way you think about developing and verifying Gbps digital and mixed-signal algorithms, and they will allow you to measure signals in ways that were not possible in the past. Each personalized SerDes tester is equivalent to multiple hardware platforms, containing everything that you need to make high-performance measurements like bit error rate testing, signal generation, and signal measurement.
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Bit Error Rate Testers
The Tektronix BERTScope® and PatternPro® families provide a range of signal conditioning and BER test solutions from 1.5 Gb/s to 40 Gb/s on 1-4 channels and deliver the test and measurement industry’s broadest serial communications test portfolio of Bit Error Rate Tester products.
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WAN Tester
The Telinc WAN Tester is a sophisticated bit error rate tester in a compact, hand held package. It can test a wide variety of communications facilities and equipment including T-1, fractional T-1, E-1, fractional E-1, modems, multiplexers, CSU/DSUs, T-1 ESF CSUs, DU, NTUs and TIUs.
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Compact, Easy To Use Tester.
Eye-BERT 40G
The Eye-BERT 40G packs 40Gbps of test capability and a color touch screen into a compact, easy to use tester. The Eye-BERT 40G offers high performance stand alone bit error rate testing at a fraction of the cost of competing testers. Its small size and stand alone operation allow for convenient field testing of QSFP transceivers as well as link verification and performance testing all in a single unit. The automated QSFP test feature also allows the user to quickly verify transceiver performance and automatically generate a report complete with unit serial number.
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Bit Error Rate Tester
100G NRZ BERT
The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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400, 200, 100 Gbit Error Rate Tester
PAM-4 BERT
The MI-PE5610-1 is a PAM-4 BERT with an integrated propriety, optical PAM-4 modulator. ROSA testing is tremebous simpliefied by the integration of the optical PAM-4 modulator in the BERT chassis. This ROSA testing solution saves time and avoids trouble shooting and accelerates your product development. The BERT provides an excellent optical PAM-4 reference output signal with adjustable OMA of the three PAM-4 eyes.The implemented 3-Eye BER technique measures the BER in real time of the 3 eyes simultanously.A wide range of selectable pattern for compliance test and signal analysis is supported.
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Bit Error Ratio Testers
Keysight’s bit error ratio test (BERT) system enables the most accurate physical-layer design verification of high-speed communication and multi-gigabit digital interfaces. Our expert-level support will help you select the high-performance hardware, control software, receiver test, and automation tools needed to help you master your design.
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Bit Error Rate Tester
Eye-BERT Gen2
The Eye-BERT Gen2 builds on our original Eye-BERT, adding extended data rates, mixed mode testing capability, and a color touch screen. The extended data rate allows for testing of links in the 125Mb to 11.4Gb range all in a single unit. The Eye-BERT Gen2 offers high performance stand alone bit error rate testing at a fraction of the cost of competing testers. Its small size and stand alone operation allow for convenient field testing of SFP and SFP+ transceivers as well as link verification and performance testing all in a single unit.
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Telemetry Transmitter for FM with up to 3 Bands
LS-11-F
The LS-11-F portable FM test transmitter is designed for checkout and troubleshooting of telemetry receiving systems operating with FM modulation. For applications with any of the ARTM modulations (Tier 0, Tier I, or Tier II), please refer to the LS-11-M Data Sheet. Complete ground stations including the antenna with LNA, RF down-converter, IF receiver, bit synchronizer, and PCM decommutator can be tested and bit error tests performed. The design allows secure links to be tested with an external encryptor. The Test Transmitter contains an internal PCM Data Simulator and Pseudorandom patterngenerator that operates in a BERT mode. The device provides simulated clock and data (without transmitter enabled) and accepts external data for modulating the internal transmitter. Complete setup can be achieved locally through the keypad and two-line LCD display or remotely through the USB Interface. Operational parameters include the PCM format parameter database information (frame sync patterns, wavewords, etc…), pre-modulation filter selection, transmitter carrier frequency, transmitter deviation, and output power level. Output power can be selected from approx. -60 to +5 dBm in 5 dB steps. The Test Transmitter contains a LiFePO4 Battery (Lithium Iron Phosphate), which provides higher energy density at ¼ the weight of legacy lead-acid batteries. The unit also provides an internal battery charger and will operate for up to twelve hours on battery power having received on a full charge.
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E1/Datacom Transmission Analyzer
DTA-BERT
DTA-BERT E1/Datacom Transmission Analyzer can perform E1 transmission performance test (BERT) and status monitoring on data link (V.35, V.24/RS232, RS449, RS530, X.21). Model T can also perform G.703-64K bit error test, PCM31/30 test and Jitter test. Featuring comprehensive functions, easy operation and compact design, DTA-BERT provides total solutions for E1 line analysis and maintenance.
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HDMI/Display Port Checker with 4ch x 12Gb/s Tunable BERT & EyeChecker
RB1204-HDMI,RB1204-DP
*Low cost continuous 4ch 1G to 12Gb/s Bit Error Ratio Tester (BERT) and Eye Checker
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Photoreceiver
A lightwave digital receiver module designed for OC-192, DWDM, and Bit Error Rate Testing (BERT) of a digital optical link. The LRD-10-M is an O/E converter with post/limiting amplifier module designed for use in receivers up to 12.5 Gb/s data optical transmission systems.
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Fiber Optic Test Solution
Eye-BERT Micro 10G
The Eye-BERT Micro 10G is a low cost, easy to use, all-in-one XFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, diagnostic monitoring, and wavelength tuning (per XFP capability). Additionally, with a click of a button, the Eye-BERT Micro 10G will automatically test an XFP module based on the information it reads from the transceiver and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Bit Error Test & Arbitrary Waveform Generation
SHF Communication Technologies AG
SHF’s Bit Pattern Generators (BPG) or Pulse Pattern Generators (PPG), Error Analyzers (EA) and remote heads form a Bit Error Ratio Tester (BERT) suite, which supports a vast number of different applications including high speed Ethernet rates like 100GbE, 200GbE, 400GbE and 1TbE. When it comes to signal generation an Arbitrary Waveform Generator (AWG) is the all-in-one device suitable for every purpose in Telecommunication, Optics, Medicine, Radar, Physics or even Quantum Computing.
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Multi-Instrument BERT Software
N4980A
The Keysight N4980A multi-instrument BERT software provides the ability to control multiple instruments through a rich Windows-based graphical user interface (GUI). Bit error rate measurements are simple to set up with the intuitive control screens. The software is ideal for setting up and performing parallel BER measurements and jitter tolerance testing (N4980A-JTS) in multi-lane and SERDES devices. You can also create your own patterns using the powerful editing tools built into the pattern editor to meet your unique requirements.
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Compact PCI Multi-function Decommutator
LS-50-cP
The Lumistar LS-50-cP 3U Compact PCI Multi-function PCM Decommutator offers the greatest flexibility in the industry by incorporating up to 10 functions typically encountered in flight test applications in a single 3U Compact-PCI card slot. Five functions are achieved on the main board (PCM Simulator which can also operate as a BERT, PCM Decommutator, IRIG Time CodeReader, IRIG Time Code Generator, and the same 5 functions can be achieved on the LS-55-DB Multi-Function Decom Daughterboard. CVSD Voice Decoding and h.261 Video Decoding are achieved through software.
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4ch, 1G to 30Gb/s Bit Error Ratio Tester (BERT) With Eye Checker
RB3004
*Low cost continuous 4ch, 1G to 30Gb/s Bit Error Ratio Tester (BERT) and Eye Checker
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WAN Tester II
The Telinc WAN Tester II is a sophisticated bit error rate tester in a compact, hand held package. It can test a wide variety of communications facilities and equipment including DDS, T-1, fractional T-1, E-1, fractional E-1, T-3 and E-3 NTUs, multiplexers, CSU/DSUs, T-1 CSUs, DTUsand TIUs. It includes a speaker to listen to voice in a DS0. It is supplied with changeable nickel metal hydride batteries and a built-in charger.
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NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise