Test Driven Development
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Product
Development Tools
C166
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The Keil 166 Development Tools are designed to solve the complex problems facing embedded software developers.
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Product
Development System
FE-51MX
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* Emulates Philips P8xC51MA/B/C , P89C669 Microcontrollers * 1MByte Code Memory * Based on bond-out Technology * Frequency up to 24MHz 3V / 5V Operation * Huge Real Time Trace Memory * Windows Debugger for C/C++ and Assembler * Target Board Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Product
Electronic Development & Manufacturing
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Our employees offer proven expert knowledge and application know-how in the development of finished products, embedded electronic systems and software applications on the most varied complexity levels. Solutions for the automotive, aviation and production industries are created using a combination of modern development methods and tools and µ-electronics, embedded electronics, firmware and software.
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Product
Development System
FE-900
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# Emulates Philips P89LPC932 Microcontrollers# Real-Time and Transparent Emulation up to 12MHz# 8K Emulation Memory# Real-Time Trace# Uses Philips Bond-Out Technology# Ceibo Windows Debugger and Keil uVision2# High-Level Support for all C/C++ Compilers and Assemblers# On-Line Assembler and Disassembler# Target Board, ISP Programmer and Power Supply Included# PLCC-28 Emulator Plug Included (TSSOP-28 Optional)
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Product
Full test development environment
XJDeveloper
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XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Product
Test Equipment Development
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PSE AG has been developing test equipment for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand that you need for your innovative research, we will design and develop it for you.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Software Development Services
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We develop our own standardized and reliable software for our test equipment which is easy to use and maintain. Our developments process includes strict guidelines and testing procedures to generate stable software combined with great performance.
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Product
Install and Development
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Whether it is an error proofing application or a complete end-of-line (EOL) test solution, ARC services what we sell by providing quality onsite installation and development as required by the project. Whether it is a senior engineering resource or our expert team of engineering technicians, ARC can provide the best solution to get your application up and running at your site when completed.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
LabVIEW & TestStand Software Development
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We are proud of our heritage in quality software development. We have a growing, successful department of accredited, experienced LabVIEW and TestStand software and systems engineers which means you can benefit from our technical experience from the first day of your project.
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Product
Software Development Kit
InterNav®
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Open architecture software with interface source code and analysis tools for integrating GPS, inertial, and other aiding sensors on a VxWorks, Linux, or Windows computer.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Machine Vision Development Software
VDM
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VDM is a LabView module for developing machine vision applications. It includes hundreds of functions for obtaining images from cameras, as well as tools for image processing, enhancement, object identification, and various measurements.
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Product
Physical Layer Test System
N19301B
Test System
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
Test Port Adapter
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
Direct conversion from cycle driven simulation data
Test program generator
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Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Product
Portable Chassis for Development, Test or Demo
D-Frame
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Elma’s D-Frame engineering development platform combines a rich feature set with portability and easy access for embedded system design efforts. Lightweight with a convenient carrying handle and rubber feet, briefcase shape.
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Product
Development Board
SOM-DB5920
Carrier Board
Development Board for COM Express® R3.0 Type 7 Modules. PICMG COM.0 R 3.0 Type 7 Pin out. COM Express ® Basic/Compact module, 10 Gigabit Ethernet support by OCP mezzanine card. Extension: PCIe x16, PCIe x8, 2 PCIe x4.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automation Product Software Development Kit
APS SDK
Software Development Kit
APS means “Automation Product Software”. APS library provides users a uniform interface to access all of ADLINK products which support it. It can cover many automation fields especially in machine automation. The most important component in machine automation is motion control. APS library was first born with motion control which co-working components such as system platform management, field bus communication function, general digital input/output, general analog input/output and various counter/timer supports are all built-in components in APS. The APS library will be an all-in-one solution in automation field of ADLINK products.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Acceleration Simulation Mode Roller Set for Vehicles with a Single Driven Axle
ASM-BF/1 | VP 230043
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Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-BF/1 roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97.
