Silicon Drift Detectors
measure X-ray radiation energy at high resolution. Also known as: SDD
See Also: SDD, Energy Dispersive X-ray Fluorescence
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Energy Dispersive Spectroscopy (EDS) Detector Technology
EDS
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The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.
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Micro-XRF spectrometer
Atlas™
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The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Energy Dispersive Spectroscopy (EDS) Platform
Octane Elect EDS System
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The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
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X-Ray Fluorescence Analyzer
MESA-50
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HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Bias Boards
CUBE
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The CUBE Bias Boards are a set of off-the-shelf biasing boards developed to speed-up the integration process of the CUBE CMOS preamplifier family of XGLab. These boards allow to bias both the detector (SDD as standard, other detector upon request) and the CUBE preamplifier.
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Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Robust DIN-rail Fanless Embedded System With Intel® Celeron® Processor N3060/N3160, 2 COM, 4 USB, 2 GbE LAN (1 PoE PD), DIO And RTC
ICO310
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The ICO310, a robust din-rail IIoT (Industrial IoT) embedded platform, supports low power Braswell Intel® Celeron® processor N3060 1.6 GHz dual-core or N3160 1.6 GHz quad-core with up to 8GB DDR3L system memory, delivering high performance and low power consumption at competitive price. The outstanding Braswell Intel® Celeron® SoC-based embedded field controller offers complete expandability and full featured I/O, including two Gigabit LAN ports, two RS-232/422/485 ports, two USB 2.0 ports, two USB 3.0 ports, one VGA port, and one DIO interface. Two PCI Express Mini Card slots, one SIM card slot and three internal antennas are available for 3G/GPRS and Wi-Fi connections. Furthermore, the ICO310 features PoE PD function, which can simplify network installation and minimize the total costs of replacement and maintenance. Its storage interfaces include an SATA SDD, as well as mSATA support on the PCI Express Mini Card slot. Additionally, the wide range 12V-24V DC terminal block power input with overvoltage and reverse protection can lower the risk of data loss under human manipulation. The reliable yet robust ICO310 is a perfect solution for industrial IoT applications such as smart energy, smart factory automation, facility monitoring systems and many more.
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Portable EDXRF Analyzer
ElvaX Mobile
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ElvaX Mobile is a portable EDXRF analyzer for testing all kinds of materials. Sampling tray as in a benchtop instrument allows for convenient placement of x-cells. High resolution SDD detector and the absence of collimators ensure high count rate, which is crucial for quick detection of trace elements.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Silicon Based Thermopile Detector: 4 Channels
ST150 Quad
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A four-channel silicon-based thermopile detector in a TO-8 package. Each active area size is 1.5mm x 1.5mm. Affordable four-channel design with strong output and a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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Silicon O/C Content Tester
OCT-2000
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Silicon Heavy-doped Pen Tester
HS-MPRT
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Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Silicon Inspection System
NIR-01
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The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Silicon Pyranometer
LPSILICON-PYRA04
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Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Detectors
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Each detector is properly housed, complete with any associated circuitry and can be mounted directly at the exit slit of any of our monochromators.
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Detectors
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Optical detectors provide additional analytical detail about your samples. When paired with their accessories, such as flow cells or nebulizers, you can obtain more information per run, fulfilling multiple detection strategy requirements.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
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Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Intelligent Silicon Photomultiplier Tube
i-Spector family
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i-Spector is a all-in-one detector and electronics instrument based on a SiPM area (18×18 mm2, 24×24 mm2 or 30×30 mm2), possibly coupled to a scintillation crystal suitable for the chosen application. The i-Spector integrates in a compact tube-like mechanics the detection stage, frontend electronics, an integrated power supply for SiPM biasing and, eventually, a digital chain to process onboard the incoming data. The i-Spector can be controlled via Ethernet and/or wireless communication based on LoRa standard.
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RF Detectors
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RF detectors from Fairview Microwave are available with N Type or SMA connector series inputs and BNC or SMA connectors for outputs. Fairview RF detectors are zero bias Schottky diode and have negative video out. These zero bias Schottky diode detectors for RF have a minimum frequency between 10 MHz and 2 GHz and maximum frequency range between 2 GHz and 26.5 GHz.
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Electrochemical Detector
800D
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The Model 800C series is designed for electrochemical detection. This instrument can be used for monitoring the current passing through a flow cell in liquid chromatography/electrochemistry and in-flow injection analysis, as well as other electroanalytical applications.
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Voltage Detector
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Shenzhen Noyafa Electronic CO.,LTD
*Detect AC Power range : 50-1000V.*Test live wire and with flash indicate.*Locate wire break point easily.*LED assist using in dark place.*Certification. Passes RoHS, FCC, and CE compliance testing, and Noyafa is certified to the ISO 9001 standard.*100% Affordable. Manufactured in China and a lot cheaper than competitor products with similar quality.
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Optical Detector
LG-9200
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The LG-9200 is a non-contact type optical detector which emits red visible light and detects the reflected light from the rotating shaft. The reflection mark is used for the detection by affixing it on the rotating shaft. It enables detection at an angle. (reflective mark: HT-011 by Ono Sokki)The LG-9200 has a built-in compact amplifier and outputs the square wave (voltage) after waveform shaping.With a compact and light weight body, performances are upgraded compared to the previous model LG-916.(LG-9200 detection distance: up to 40 mm, response speed: up to 40 m/s)
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Precipitation Detector
HD2013.3
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Rain, snow, hail detector - Modbus-RTU or 4-20mA or 0-10V or contact output.
