Surface Profiling
See Also: Surface Profile, Surface Profilers
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Color Calibration & Profiling
For both amateurs and professionals photographers, filmmakers, designers, premedia and printing operators achieving predictable results from capture to output can be a challenge. Color Perfectionists turn to X-Rite for affordable, professional, quality calibrating and profiling solutions that make sure all of your devices monitors, projectors, cameras, scanners, printers and mobile devices are speaking the same language.
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Surface Resistivity Meter
395
The ACL 395 handheld meter features sophisticated circuitry that allows for the same advantages as megohmmeters, but at an economical price. Utilizing color-coded zones, the LED scale is easy to read and evaluate. Half decades indicate where the measurement value falls within the decade giving a closer indication to actual value. Unlike other pocket-sized meters, the ACL 395 features rubber rails which provide the best possible contact.
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Profile Controller With Data Logging
IM2756
Ajinkya Electronic Systems also manufactures profile controller data logging which is process controller for controlling process parameter against time. User can define the profile he wants with the help of extensive instruction set. Unit supports instructions like jump, loop, loop with count apart from ramp soak control. Relay On and Off instruction are supported.
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Performance Profiler / Memory Leak Detector
GlowCode
GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Specialized Beam Profiler Systems
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
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Game And Profile Measurement Systems
MFF markets Gap and Profile measurement systems. From the innovative GapGun Edge Break that uses a portable laser measurement system to bring precision to the shop floor, to the Gap Gun Pro that represents the simplest yet most technologically advanced and reliable thing that can arise from a development matured through years of daily use in the process control phases.
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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Optical Tactile Surface Finish
1000Z
The Adcole Model 1000-Z features both optical and tactile measuring heads to deliver high precision surface measurements of camshafts, crankshafts and turned parts. The non-contact interferometric probe greatly expands on the measurement capabilities from the diamond tipped contact probe of the standard Adcole 1000 gage, as the optical accessory can precisely measure surface finish of cam track groove sidewalls, cam track bottom grooves and more. Profilometers such as the 1000-Z quantify surface roughness and are relied on to maintain quality and identify potential problems in the manufacturing and coating process.
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Profile Projectors and Vision Systems
Aberlink's revolutionary measurement software provides you with a powerful, yet easy-to-use user interface. This means you can use the Aberlink 2D software on your profile projector or vision system within 15 minutes of being shown the inspection routines for the first time. You will substantially increase the measurement capability of your profile projector and part inspection through-put.
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3U OpenVPX 6-slot Profile BKP3-CEN06-15.2.2-n
65c306-1522-30
3U OpenVPX Backplane 6-slot, VITA 65, Backplane profile BKP3-CEN06-15.2.2-n, payload slot profile SLT3-PAY-1F2F2U-14.2.2, switch slot profile SLT3-SWH-6F6U-14.4.1, power connections with M3/M4 power bolts.
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BET Flowing Gas Surface Area Analyzers
SA-9600 Series
The surface area of a material is, in many cases, as important as the chemical properties. As particle size decreases, surface area increases. Porosity of materials - from micropores to macropores - contribute even more to the total surface area. The interface at the surface is what defines how a solid reacts to other substances, be they gases, liquids, or solids.Surface area can impact shelf life, stability, dissolution and efficacy of pharmaceutical powders and tablets. Likewise, surface area can affect the rheological properties and hiding powers of pigments, paints, and coatings. It has a significant impact on the ability for materials like catalysts, adsorbents, filtration materials and air separation products to react in the designed application. Ceramics used in applications ranging from; dinner plates, to dental implants, to electronics, all are affected by surface area.
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3D Sensor (Shiny Surfaces)
reflectCONTROL
reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Non-contact 3D Optical Profilers
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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Thermal Profiler
MEGAM.O.L.E.® 20
Do you demand the highest density of thermocouples placement possible on your Hi-Reliability, High-Value PCB? ECD's got your Spec! Do you expect a software package that flexes with your workflow, providing customizable data extractions, Imports of your .MDM M.O.L.E. libraries and compatibility with your intranet, Excel, and all ECD M.O.L.E. profilers?
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Surface Imaging & Metrology Software
Mountains®
Analyze multiple types of surface data. Turn your surface data into accurate, visual surface analysis reports. See every feature with high quality real-time 3D imaging of surface topography. Characterize surfaces in accordance with the latest metrology standards.
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LIXI Profiler
The LIXI Profiler uses our proprietary technology, Radiometric Profiling, the only NDT technology that allows you to see everything you need to manage a healthy pipe system without touching a thing.
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Observational Systems: Profiling Floats
Autonomous profiling floats are revolutionizing the way scientists study the ocean. Before the first profiling float entered the water, our ability to measure climate, biological, and chemical trends was limited in scope while large-scale studies were a costly endeavor.
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6U OpenVPX 6-slot Profile BKP6-CEN06-11.2.8-n
65c606-1128-30
6U OpenVPX Backplane 6-slot, VITA 65, Backplane profile BKP6-CEN06-11.2.8-n, payload slot profile SLT3-PAY-2F2U-14.2.3, switch slot profile SLT3-SWH-6F6U-14.4.1, power connection with M3/M4 power bolts.
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Roundness And Cylindrical Profile Measuring Instruments
We respond to a variety of needs with our lineup including both rotating table types that enable high precision measurement of cylindrical workpieces, and rotating type detectors that handle eccentric or heavy workpieces.
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Surface Roughness Tester Profilometer
TIME®3231
Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools. Up to 55 paramenters for roughness, waviness and primary profile are supported. Apart from those features mentioned above, TIME®3231 is loaded with 90° measurement function.
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Surface Mount Reed Relays from Pickering Electronics
Pickering Electronics Surface Mount Reed Relays contain the highest quality instrumentation grade reed switches making them suitable for the most demanding applications and are suitable for infra-red or vapor phase reflow soldering.
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The Complete Solution for Optical Surface Quality Inspection
OptiLux SD (Scratch-Dig)
RedLux’s OptiLux SD system provides the complete solution for control of optical surface quality (scratch-dig) by offering a breakthrough in measurement performance along with conformity to industry standards. Designed with flexibility in mind and further enhanced by a range of customer inspired features, the OptiLux SD can support the most demanding of optical surface quality inspection processes, from highly customized optical components in low volume, to standard components in high volume.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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6U OpenVPX 9 Slot Profile BKP6-CEN09-11.2.13-1
1OVX609VX1-1X01R
VPX central switch, up to 3.125 Gbps per channel.
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In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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6U OpenVPX 6 Slot Profile BKP6-CEN06-11.2.26-3
1OVX606UZ3-1X01R
VPX single star backplane with a data plane with 4 fat pipes to each of 5 payload slots, a dual fat pipe expansion plane and an ultra thin pipe control plane.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
