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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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PCB Test And Design-For-Test Services Group
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Design-for-Test
As designs move to smaller and more complex process technologies, ensuring devices are thoroughly tested becomes a bigger challenge. Mentor Graphics provides whole-chip test solutions that can help improve test -- and, therefore, device -- quality as well as control, or even reduce, the cost of test.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Tester & Programmer
TP-TACT
TP-TACT is designed to test the efficiency and program the operating range of electronic turbocharger controllers.
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Electronic Safe & Arm Devices
Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1316 compliant Electronic Safe and Arm Devices (ESAD), Electronic Safe, Arm and Fire Devices (ESAF), and Firing Modules (FM) for safe fuzing requirements of both legacy and next-generation missiles and munitions. Our dedicated staff of research and design experts use the latest advances in technology to design smaller, lighter, and more cost effective ESAFs and FMs to meet evolving requirements of newer more sophisticated weapon systems. Capabilities include a line of components and subsystems that have been qualified for hard target penetration environments and next-generation smaller-class munitions.
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Systems Modeling
Altair model-based development (MBD) tools drive fast development for smarter connected systems. Altair customers simulate complex products as systems-of-systems throughout your entire development cycle from early concept design to detailed design to hardware-in-the-loop testing (HIL). Explore more by combining mechanical models with electrical models (in 0D, 1D, and/or 3D) to enable multi-disciplinary simulation and leverage automatic code-generation for your next generation embedded systems.
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N Test Finger Nail
TF-24 series
Are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Dial Torque Screwdrivers
A dial measuring torque screwdriver is designed for torque testing and torque verification. It is a versatile tool that is utilized for torque auditing and product evaluation. It can be used to monitor torque as it increases or decreases or display peak torque applied. The dial screwdriver is used in two common torque verification tests. One is the first movement test and the second is the loosening test. The screwdriver is standard instrument in engineer’s tool kit.
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Circuit Breaker Test Systems
Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Digital Multimeter
DM3058/E
DM3058 / DM3058E is an economical 5.5-digit digital multimeter. It is designed for the test requirements of high accuracy, multi-function and automatic measurement. It integrates the functions of automatic measurement, multiple mathematical transformations and any sensor measurement. It provides USB, GPIB (DM3058 only), LAN (DM3058 only) and RS232 interfaces.
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Design-for-Test And Semiconductor Data Analytics
Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
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50Hz-100kHz LCR Meter
Chroma 11022/11025
Chroma Systems Solutions, Inc.
The Chroma 11022 and 11025 LCR Meters are passive component testers that can give you the most cost effective alternative equivalent to the high priced meters. They are designed for the demanding applications in production test, incoming inspection, component design and evaluation. Programmable test signal level settings are from10mV to 1V in a step of 10mV, and the VM/IM signal level monitor functions allow you to evaluate your devices at the level you specify. Ten test frequencies of 50Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, and 100kHz, can be used to evaluate passive components and transformers/ LF coils.
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MCB Instantaneous Trip Test Bench
The SCR Elektroniks MCB Instantaneous Trip Test Bench is designed for Testing of MCB to carry out “Test of Instantaneous Tripping and of correct opening of the Contacts” as per IEC: 60898-1:2002 Clause 9.10.2 at rated voltage. This test is carried out with power factor between 0.95 and 1 with the sequence operation being O-t-CO-t-CO-t-CO with timings as specified in 9.12.11.1.
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Dip Clip, 16 Pin With Nickel Silver Contacts
3916A
Dip Clip, 16 pin with Nickel Silver contacts. Pomona DIP Clip® test clips are designed for testing dual-in-line IC packages on PC boards. These devices incorporate many built-in features that assure a positive electrical connection as well as hands free testing.
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Dual Surge Current Generator
MIG0624T-K12
Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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END-to-END VALIDATION TESTING
SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
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Digital Multimeters
Fluke Digital Multimeters (DMM's) are on more tool belts, finding more problems, than any other comparable test tools. Each design is tested to the extreme: drop, shock, humidity, you name it. Every Fluke Digital Multimeter gives you what you need: accurate measurements; consistent, reliable performance; attention to safety; and the strongest warranty available.
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Naturally-Aspirated/EVAP Automobile Diagnostics
Diagnostic leak detection equipment specifically designed for EVAP testing naturally-aspirated automobiles and light-duty trucks.
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Three Phase Closed I-P Link Energy Meter Test Bench Type KP-S3000-B
Bofa Instrument & Equipment Co., Ltd
Three phase closed I-P link energy meter test bench, type KP-S3000-B, is designed for testing three-phase energy meters, especially for testing Closed I-P Links three-phase energy meters. It is an ideal testing equipment for energy meter factory or R&D institute. All the testing procedures can be automatically operated by PC or by Keyboard manually.
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Monitor and Test Video Quality
Torque Electronic Couch Potato (ECP)
The ECP is designed to monitor and test video quality of experience. This affordable, compact, palm-sized monitoring probe monitors true customer viewing experience by providing measurements from the end users’ point of view, after the STB. Scanning through available channels or navigating through interactive content menus via an external IR blaster, the ECP provides a single dashboard highlighting service quality across all channels.
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30 Amps, 50 MHz BW Current Probe - AC/DC , 50 Amp Peak Pulse
CP030
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Load Testing for Evolved Packet Core (ePC/VePC)
Flare
Linkbit Flare is designed for load testing of Evolved Packet Core (ePC) networks, and the upcoming VePC deployments. It is based on the technology initially develped for Linkbit functional testers, and as a result is extremely flexible.
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Vibration Test Chambers
Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.
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Backflow Prevention Test Kit
BTK2
he Model BTK2 Backflow Prevention Test Kit is capable of testing hydronic systems with test procedures recommended by ASSE, AWWA, CSA, FCCC, HR-USV, and NEWWA. The BTK2 is comprised of three valves and is specially designed for testing backflow prevention assemblies. The tests can be completed in almost any area by mounting the unit with the included high performance elastic cord. PTFE-lined brass ball valves simplify the adjustment procedure. The large, easy-to-grip needle valve allows for quick adjustment.
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Audio Frequency Output Power Meter
PGP Electronics Private Limited
PGP Electronics AF Output Power meter, model 3301provides reliable measurement of Audio Frequency Output Power. The audio power output meter, measurable from 0.01mW to 30W in 12 decades with 10 different termination impedances with both balanced and un balanced inputs. The instrument is very useful to conduct students projects, design and test simple sub systems in laboratories. New improved design features provides reliable working even in adverse environments.
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Charge Coupled Device (CCD) Image Sensors for Space and Ground-Based Astronomy
(CCDs) for Space science, Ground-based Astronomy, and Earth observation applications with an impressive record of successful deliveries to a wide range of customers over 40 years.All Teledyne e2v devices can be supplied partially or fully customised to fit the application and achieve the best possible system performance. CCD image sensor design, manufacture, test and characterisation are carried out in-house enabling control from start to finish. Multi-polysilicon, multi-metal and back-illumination options are available for high resolution, high sensitivity and very low noise.
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Gearbox Tester
The gearbox tester was designed to test the Azimuth Drive Unit (ADU) for a missile launcher. The ADU is the horizontal position controller for the launcher. It consists of a main drive shaft, a manual drive shaft and an output drive shaft. This system uses a multi-axis motion controller to operate.
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Digital Megohmmeter
800
The ACL 800 Digital Megohmmeter is a dependable and easy-to-use audit kit that is designed to test static dissipative surfaces for electrical resistivity and resistance according to industry standards such as ANSI/ESD test methods S4.1, S7.1, and ASTM D257. Tests are easy to perform with or without the 5lb probes. Use optional concentric ring probe for conformance to STM11.11.
