Performance Testing
determines degree of ability.
See Also: Conformance, Qualification, Benchmark, Failure Analysis
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Product
Power Performance Test
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The performance index of power product is decide the product quality, so it is very important to accurately test performance index in every stage to make sure that the product performance is conform to design index. Energy efficiency index includes power factor, input power, input voltage and etc.
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Product
Automotive Testing
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Unique E-Marking Service: Efficient, Flexible and Quality Kiwa Dare is a full compliant test house that perform tests and measurements for customers so that the E-Marking (type approval) can be obtained on vehicles or automotive products and components.
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Product
RFIC ATE System
RI 7100A
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The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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Product
DPK Pressure Test Kits
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The pressure test kits of the DPK3 R1 and DPK3 R2 series are used to perform leak tests on pipelines and fittings. A data logger for pressure and temperature measurements logs the test pressures and temperatures. A test report is created at the construction site via a battery-operated printer. The measurement data can be transferred to a PC for further archiving and evaluation.
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Product
VLF Test System
BAUR PHG 70 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Product
Microwave/RF Cable Test Assemblies, 110 GHz
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Gore offers a rugged, lightweight 110 GHz test assembly that optimizes the performance of test systems while reducing the total cost of test and ownership over time. Our assemblies provide reliable electrical performance with flexure and temperature in demanding environments.
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Product
AC High Voltage Test Sets
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We are highly reckoned among clients for manufacturing and exporting an excellent AC High Voltage Test Set. It is specially engineered and developed for performing varied tests on air conditioner. As to satisfy clients' requirements, we can also optimize this test set. Manufactured in accordance with industry standards using supreme grade raw materials, this AC High Voltage Test Set is offered to clients at industry leading price. Before the final dispatch in market, this test set is stringently tested on varied quality parameters.
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Product
Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Product
Battery Pack Test Equipment For 1-2 Series Battery
TOB-W602
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Xiamen Tob New Energy Technology Co., Ltd
1-2 Series Battery Pack Test Equipment Used For Mobile Phone Battery Performance Testing 0-10V
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Product
Splinter Shields
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AMETEK Sensors, Test & Calibration
Splinter shields for use with materials testing machines are available to protect the user when testing brittle samples which are liable to fragment. The shields help prevent sample splinters from leaving the test area when performing a test.
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Product
Brushless/Servo/Stepper Motor Tester
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Shanghai Aoboor Electric Co., Ltd.
Applicable to brusheless, servo,stepper motor performance test.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Multimeter/DC Power Supply
U3606B
DC Power Supply
Looking for a one-box source and measure device to meet your measurement needs? The Keysight U3606B multimeter / power supply is a full-featured digital multimeter (DMM) that comes with a built-in 30-W power supply unit. This hybrid multimeter and power supply measures voltage and current simultaneously enabling you to perform two test functions within the same unit.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
