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AOI/SPI Inspection Systems
Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AOI/SPI Inspection Systems
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Automated Headlight Tester
VLT 0936/MK2
Fully computerized controlled CCD Head-light Beam Tester, with fully automated vertical and horizontal movements, with automated searching of the hot spot of the beam. This robot type Headlight Beam Tester is connected to the Vehicle Test Lane Computer system and displays instructions and results to one of the large overhead SVGA monitors of the Test Lane.
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Automated Torque Tester
NJY-H5
NJY-H5 Automated Torque Tester is professionally suitable for testing the torque value of the caps of packaging products such as bottles, beverage bottles, mineral water bottles, and milk bottles. It is an ideal configuration instrument for offline or online testing of production units in the packaging industry.
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Automated Development Framework
TestPoint
TestPoint is an automated development framework built to maximize code re-use, minimize maintenance, and abstract complexities from developers.
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Automation Testing
At Updoer Technology, we strive to provide a streamlined experience. We follow the test-driven approach to maintain your app's quality, and you get bug-free software and quality at its best! As a valued client, we want to ensure that you're getting what you paid for; Your satisfaction comes first at Updoer Technology because we value relationships over everything else.
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Dimensional Inspection
Initial Inspection Sample Reports (ISIR's)• Production Part Approval Process (PPAP)• Capability Studies• Production Surveillance• Reverse Engineering• Third Party Arbitration• Will Provide Same Day Quotation With Part and/or Print• Immediate Service Available
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Power System Automation
Schweitzer Engineering Laboratories, Inc.
Automate your power system with SEL instrumentation and control devices. Substation automation uses data from IEDs, control and automation capabilities within the substation, and control commands from remote users to control power system devices.
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Integrated Automation Systems
When high-performance motion is at the core of your process, our expertise will get your custom automation system up and running faster and more reliably than the competition.
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Mini Fiber Optic, Contact, ITA, Multimode
610113173
* This contact available for purchase as a patchcord only. Choose link below to configure as a patchcord. Primary mating contact 610113172. (May mate with other Receiver contacts, as well.)
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UI Automator
Time to time we cover new frameworks here at Testdroid Blog and despite UIAutomator really isn’t a new framework for Android app testing, some things have changed quite a lot from the version 1.x to 2.0. That being said, the fundamental purpose of UIAutomator framework hasn’t changed and it still allows its users to focus on UI testing and provides a lightweight, but very efficient and easy-to-learn API to get things done fast.
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Thickness and Flaw Inspection
MultiScan MS5800
Eddy current testing is a noncontact method used to inspect nonferromagnetic tubing. This technique is suitable for detecting and sizing metal discontinuities such as corrosion, erosion, wear, pitting, baffle cuts, wall loss, and cracks in nonferrous materials.
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Non-Destructive Inspection Equipment
Non-destructive inspection means that various materials such as metal are "without damaging the object, knowing the presence or absence of scratches on the surface or inside and the degree of scratches, and passing the object against standards such as standards.
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Inspection Assist Software
RVI software is a must for streamlining your inspection processes and improving overall efficiency. Olympus inspection assist software provides support throughout the entire process, whether streamlining on-site inspections or assisting with remote report generation.
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Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Semiconductor / FPD Inspection Microscope
MX61L
Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Bond Inspection
Increasingly thin wires, finer pitches, as well as more applications of thick wire for higher capacities are among the current trends in wire bonding. At the same time, the requirements for robust and defect-free bonds are increasing, for example in assistance systems in the automotive sector and in RF modules in the 5G mobile communications network. This makes reliable inspections extremely important.
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Soldering Inspection Video Microscope
MS-1000
The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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On-site EL/PL Inspection Machine
“EPTiF”
"EPTiF (EL/PL Test in Field)" enables you to check invisible conditions of installed solar panels during daytime by EL and PL inspections, which are adopted by a number of solar panel manufacturers, without detaching solar panels. Irradiance-independent and steady results can be obtained. This is the first in the industry.
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X-Ray Inspection System
MXI Quadra 5
Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Optical OTDR
TLM-02D
Hangzhou Tuolima Network Technologies Co., Ltd.
OTDR-02D series Optical Time Domain Reflectometer (OTDR) is an intelligent meter of a new generation for the detection of fiber communications systems. With the popularization of optical network construction in cities and countrysides, the measurement of optical network becomes short and disperse; OTDR-02D is specially designed for that kind of application. It’s economic, having outstanding performance.
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Automated Inspection Systems
Our systems utilize phased array and eddy current array to inspect the full volume and surface of various products and profiles in many manufacturing industries, such as metal, aerospace, transportation, power generation, and oil & gas.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Test Automation Management
In many organizations, testing is split: Automation testing is still disconnected from manual testing, and results are reported separately. This makes holistic decision-making, based on the overall testing, close to impossible. Running and managing both your manual and automated tests in PractiTest ensures the coverage of your entire process and gives you a holistic view of your entire QA operation. PractiTest is a centralized solution that helps you make data-driven decisions, focus your team’s efforts and improve your process.
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Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Custom Automated Test Equipment
Peak Production has a team of highly qualified electrical and electronic design engineers that excel in the rapid development of Custom Automated Test Equipment (ATE), integrating test equipment from our multiple long term partners.
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Optical Connectors
Radiall's full range of optical interconnect solutions includes standard interfaces, optical termini, optical connectors and custom optical assemblies and subsystems. Suitable for harsh environments and designed for demanding applications where reliability and high performance are required, our cost-effective optical connectors are adapted to the specific requirements for the telecom, industrial, aerospace and defense markets.
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Vision Inspection Systems
We have available with us diverse array of Vision System. These systems are based on high-end technologies and meet the requirements of diverse sectors. Further, our systems are an epitome of quality and available at economical prices. Details of different systems.
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Optical Access
CXR offers a choice of conversion and optical transport Ethernet or TDM streams, and CWDM optical multiplexing.
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3D Measurement And Inspection
LOTOS
LOTOS automatic measuring systems can measure the full outer contours or individual areas of any measurement object quickly and precisely, irrespective of the shape, and test them for imperfections. The three-dimensional, non-contact measurement is carried out using optical measurement sensors with accuracy in the μm range. The result is a representation of the measurement object as a 3D model. Powerful, intuitive software allows the measurement results to be assessed extremely quickly.
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Automated Shock Test Systems
AutoShock-II Test System
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
