XRF
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: X-ray Fluorescence, X-ray Fluorescence Spectrometers, XRF Analyzer, EDXRF, TXRF, WDXRF
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XRF
P Series
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The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.
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XRF
G Series
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The G Series’ two most distinctive features are precision video imaging, and “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus. The latter is a feature unique to Bowman. An available manual XY stage with 1.5 X 1.5” travel facilitates easy positioning of small and large parts. The chamber is relatively small when compared to other models like the B Series. The smaller chamber and footprint is well suited for jewelry and other precious metal analysis applications, and components such as connectors and fasteners.
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XRF Analysis
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Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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XRF analysis
X-Supreme8000
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Handheld XRF Analyzer
Vanta Element
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The Vanta Element XRF analyzer series provides elemental analysis for fast alloy grade identification and sorting at an affordable price. The series is available in two cost-effective models
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XRF
B Series
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The B Series represents the most basic top-down measurement configuration that Bowman offers. The sample stage is a fixed base plate, requiring operators to manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.
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XRF, AA & ICP sample preparation
Claisse Range
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Designed for unprecedented analytical accuracy and repeatability, Claisse® electric and gas automatic instruments set new benchmarks in fusion capabilities. The same is true for Claisse pre-fused and homogeneous borate fluxes, high-quality platinumware, as well as analytical consulting services.
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Handheld XRF Analyzer
Genius-XRF
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
Based on the mature technology of desktop X-ray fluorescence analyzer and the latest technological development, and on the performance of the existing international commercial handheld X-ray fluorescence analyzer, adding new elements into it on the basis of the first, second, and third generation, Skyray Instrument has developed the intellectual portable fourth generational handheld analyzer-Genius XRF series, which can satisfy the market requirements and possess independent intellectual property rights.
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Handheld XRF Analysers
X-MET8000 range
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Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
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Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Lead Paint Handheld XRF Analyzer
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DELTA Lead Based Paint Handheld XRF Analyzers test for Lead (Pb) in seconds. These reliable, tube-based units are light in weight and ergonomically designed for all-day testing. They start fast and stay fast - no isotope fade. And, they have a low total cost of ownership. Before you begin structural repair - grinding, cutting or painting - screen for Pb; then, check your work area after clean-up.
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Precious Metals Handheld XRF Analyzer
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The DELTA Precious Metals XRF Analyzer provides fast, accurate alloy chemistry and karat classification with one nondestructive, non intrusive test. Whether importing precious metals, selling or producing jewelry, or processing scrap metal, Innov-X XRF is the ideal choice.
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Scrap Handheld XRF Analyzer
DELTA
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DELTA Scrap Sorting Handheld XRF Analyzers provide reliable ID in 1-2 seconds for most alloy grades and pure metals. They are designed for durability to withstand the toughest processing environments. Get fast, reliable alloy sorting and analysis for a wide variety of ferrous and non-ferrous materials in seconds.
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Handheld XRF Analyzer
ProSpector II
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ElvaX ProSpector is a powerful handheld analyzer employing the latest developments in XRF analysis. Due to the advanced electronics and state-of-the-art mathematical algorithms ProSpector provides ultimate quality of measurement within a couple of seconds. It is an intuitive and user friendly instrument for highly accurate elemental analysis in a variety of applications.
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XRF Analyzers
X-STREAM
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For some time, glass ceramics have been causing problems throughout the glass recycling industry. The melting behavior of glass ceramics is different from that of 'normal' glass; therefore, they will not dissolve in the melting tank at the glassworks, or dissolve only with great difficulty.
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XRF Analyzers
Vanta iX
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The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Handheld XRF analyser
X-MET8000 EXPERT GEO
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Handheld XRF analyser for environmental soil screening and mining analysis. The X-MET8000 Expert Geo is a handheld XRF analyser for geochemistry applications including fast on-site environmental screening, mining exploration, planning and grade control. Easy to use and designed to withstand the harshest environments and weather conditions, the X-MET8000 Expert Geo offers results in seconds with real time data sharing for fast decision making.
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Consumer Safety and RoHS Handheld XRF Analyzer
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DELTA Consumer Safety & RoHS Handheld XRF Analyzers allow for testing large quantities of consumer & electronic products anywhere, anytime. Get simple, fast, nondestructive regulatory compliance screening for Pb, Cd, Hg, Br & more. Use for ASTM Method F2617-08, HR4040, CPSC, CPSIA & more.
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Benchtop XRF Analyser
Lab-X3500
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The Lab-X3500 is designed to perform in a wide range of locations wherever quality control is required, e.g. in the laboratory or on-site.
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XRF Instruments
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FISCHERSCOPE® X-RAY XRF measuring instruments are exactly what you need. Precise, fast, reliable and durable: Measure coating thicknesses and analyze materials non-destructively, contact-free and conveniently. The instruments are easy to use and suitable for almost any application.
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Product
XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Micro XRF
W Series
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The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
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Sulfur Benchtop
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XOS offers a variety of sulfur analyzers suitable for a wide range of analysis, throughput requirements, and operating environments. Imagine a smarter analysis solution free of compromise: hassle-free sample prep, easy operation, rapid testing, compliance flexibility, and industry-leading precision. These analyzers range from monochromatic wavelength dispersive XRF (MWDXRF) to high definition XRF (HDXRF) systems, delivering direct measurement without the need for consumable gasses or sample conversion.
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Portable XRD System
TERRA
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The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
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High Performance XRF Measuring Instrument
FISCHERSCOPE® X-RAY XAN® 250
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Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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Mining and Geochemistry Handheld XRF Analyzer
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DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings
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Materials Metrology
VeraFlex Family
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World-class XPS and XRF metrology technologies for semiconductor process control.
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Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Product
XRF
M Series
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The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
