Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Solder Paste Analysis
SPA1000
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The SPA 1000 also introduces new process control capability by accurately measuring the suitability of the solder paste prior to its implementation on the production line. It achieves this by determining the "Open-Time" for the paste. It also performs the Slump Test and both of these methods provide a "Go/No Go" answer in less than 30 minutes to ensure minimum delay for the production line.
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Spectroscopy
NIRS XDS Process Analyzer
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NIRS XDS Process Analyzer systems can measure a variety of sample types, such as granules, powders, liquids, slurries, or opalescent substances, among others. These analyzers provide fast, nondestructive analysis of pharmaceutical, chemical, and petrochemical products. If required, up to 9 inline measuring channels can be multiplexed with this system.
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Non-Contact Chemical Concentration Monitor
CS-900
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In order to fulfil the tight chemical concentration control required in semiconductor WET process, HORIBA realizes higher functionality to meet the needs by designing compact equipment while maintaining stable measurement and carrying out operator safety through its original sensor design.
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Spectroscopy Card
microDXP
Instrument Card
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Measurement, Data Analysis, Visualization, Automation
Imc STUDIO
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With imc STUDIO, you are ready to start your measurement in a few minutes. A clearly organized channel configuration list, extensive sorting and filtering functions, numerous assistants, built-in sensor management and support of TEDS are just some of the useful functions for achieving quick, intuitive system configuration.
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Electronic Tachometers
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1 1/4″, 2 1/4″ & 3 1/8″ Aircore Propeller tach for Rotax912/914 engines, connects to tach coil, calibrated to Propeller RPM, not Engine RPM! Custom color marking available, internal light optional! Hourmeter can be set to count engine time or flight time and preset to any numbers —(must be done at UMA facility)!—Standard setting 800rpm & above. White or Antique yellow dial with black numbers available, per request!
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Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Electronic Resistance Stores
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Is designed to reproduce the values of resistance to direct current through channels independent and galvanically isolated from each other and from the case.
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Image Analysis Software
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Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
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Electronic Toy Tester
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Programmable ultra high resistance tester is used to test the high resistance of different kinds of material.
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Pine Electronics
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Specializing in low-mid volume electronic manufacturing services, Pine Electronics, Inc. offers a wide range of printed circuit board assembly (PCB assembly), cable and box build assembly solutions. Our equipment, engineering and technical talent serves both multi-national and regional customers throughout the United States. Known for full-service PCB assembly work, Pine Electronics, Inc. is highly integrated and responsive. Each customer has a designated representative for all commercial and technical questions. This personalized service model enhances communication, expedites project development, and represents Pine’s commitment to customer service.
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System Grounding & Earthing Analysis
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ETAP's system grounding & earthing foundation automatically detects the system earthing configuration based on source and transformer grounding or earthing type selection. The resulting earthing types are displayed both on the one line diagram and for the various connected cables.
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Construction Analysis
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Customers of MASER Engineering that are using electronic components and materials are interested in the manufacturing quality and used materials.
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Medium-power DC Electronic Load (900W~6000W)
FT6400A Series
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Shenzhen FaithTech Technology Co., Ltd.
The FT6400A series has modular design, with strong adaptability, high reliability and high maintainability. Mainly used in power electronics testing fields such as power batteries, medium and high power DC power supplies, DC generators, etc. The FT6400A electronic load not only provides OCP, OVP, OPP, OTP, RVP but also provides Von and Voff functions and programmable protection functions for the device under test. These features can greatly improve the reliability of the product, and it is a reliable product for engineering test and automatic test system integration.
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DC Electronic Load
63600 series
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Chroma's 63600 series DC electronic loads are designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, server power supplies, and power electronic components. They are excellent for research, development, produc t ion, and incoming inspection applications. The 63600's state of the art design uses DSP technology to simulate non-linear loads using a unique CZ operation mode allowing realistic loading behavior. The 63600 series can draw its rated current under very low voltage (0.4V typical). This unique feature guarantees the best loading performance for modern Point-of-Load conditions and fuel cells.
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Spectrum Analysis, Up To 43.5 GHz
S930904B
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The S930904B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 43.5 GHz.
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Test and Analysis
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ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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Indicators - Electronic
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An electronic device used to read an input value from a measuring device and show a displayed value.
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Electronically Tunable Filters
ETF
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Radar. Communications. EW/SIGINT. Frequency agile channelization. Frequency agile noise rejection filter. Local oscillator tracking filter. Controlled bandwidth and center frequency noise source.
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Product
Particle Size Analysis
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Particle size analysis is a technical procedure to characterize the size distribution of particles in a powder or liquid sample. It is widely used in R&D and quality control in industries involved with nanotechnology, pharmaceuticals, cosmetics, food, electronic materials, sintering materials, Li-ion battery electrodes, etc.
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Electronic Dendrometer
CRITERION RD 1000
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F. W. Breithaupt & Sohn GmbH & Co.KG
*BAF: Visually estimates if trees fall in or out of a given plot as related to the specified Basal Area Factor.*In/Out: Internally computes the limiting distance for questionable, borderline trees and determines if they are in or out of the plot.*Diameter: Determines the diameter of a tree at any given height.*Height/Diameter: Provides the ability to determine the height at which a specific diameter occurs.*Raw Inclination: Measures inclination in percent slope.
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Town Gas Analysis
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Periodical monitoring of calorific values is necessary to ensure a stable supply of town gas. Since Shimadzu’s system GC is robust and designed for automated analysis, it is widely used for 24 hour/day online analysis in this field.
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Programmable DC Electronic Load - (Economical)
63200E Series
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The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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Audio Spectral Analysis Freeware
PSELab
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Power Spectrum Estimation Laboratory
"PSE Lab" is a freeware Windows application useful to estimate power spectrum and time frequency distribution of signals. To estimate power spectrum, the application uses following methods: periodogram; using the simplex algorithm to estimation of complex exponential model optimal parameters; using the quasi-Newton algorithm to estimation of complex exponential model optimal parameters; least squares Prony method; modified least squares Prony method; Burg method; modified covariance method; MUSIC..
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Dynamic Particle Image Analysis System
iSpect DIA-10
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Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
