Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Product
Spectrum Analysis For P50xxB Up To 4.5 GHz
S970900B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Product
Dual DC Electronic Load
3330F Series（40W~250W）
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3330F Series Dual DC Electronic Load is a two load unit in one module. Each 3330F Series module has its own control and display panel, CC/CR/CV/CP/ Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be remote controlled via RS232、Ethernet、USB and GPIB interface.
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Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Neutron Activation Analysis
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Neutron Activation Analysis (NAA) is one of the most sensitive analytical techniques used for multi-element analysis available today. The NAA procedure is capable of providing both quantitative and qualitative results for individual elements, with sensitivities that can be superior to those possible by any other analytical technique. Elemental Analysis Incorporated (EAI), as an innovator in the development and application of radio-nuclear chemistry analytical techniques, now offers its clients the ability to analyze some 75 individual elements (including certain organic elements) by NAA at trace and ultra-trace concentrations. Moreover, by developing scientific liaisons with selected nuclear reactor sites in North America, EAI is able to offer customers the expertise and capabilities of the premier scientists and research facilities available today. Combined with EAI’s tradition of excellence in customer service and technical assistance, EAI is uniquely positioned to assist clients with timely, cost-effective, and reliable trace element analysis for almost every conceivable field of industry or scientific research.
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Product
Stream & Video Quality Analysis System
VQTS-300
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VQTS-300 is a self-contained solution, combining:HDMI/DVI, Display Port or LVDS grabber - one of Unigraf UFG-04 range capture cards, order optionPowerful stream analysis tools - Unigraf UFG-04 softwareSophisticated image quality analyzer - VideoQ VQMA3 softwareIdeal tool for development labs, software developers and high volume manufacturersEasy-to-use tool, instantly revealing your source-sink link status, video camera or other video device performanceUser-selectable reporting modes:machine-readable file with Pass/Fail marksdetailed multi-page PDF documentManual and automated performance measurement of HDM/DPI links, video cameras and/or video processorsVia optional SDI-HDMI adapter VQTS-300 measures the performance of 3G-SDI/HD-SDI video processors
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Product
Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
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Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
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Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Product
Self-Discharge Analysis Software
BT2155A
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The Keysight BT2155A self-discharge analysis software, controlling the BT2152A or BT2152B self-discharge analyzer, measures and records Li-Ion cell self-discharge current and cell voltage. The software configures the analyzer’s channel settings, such as initial voltage and current matching, channel limits (OVP, OCP, UVP), measurement intervals, and test duration.
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Electronic Moisture Analyzer
MOC-120H
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The moisture content of a variety of samples can be measured using an array of drying modes. The drying status can be seen at-a-glance with the fluctuation range display. Active in a variety of fields (cereals, starch, flour, noodles, brewed products, sea foods and marine products, meat products, spices, sweets, dairy products, dried foods, vegetable oils and other food articles; pharmaceuticals; ores; cokes; glass materials; cement; chemical fertilizers; pulp and paper; cotton; various fabrics and other industrial goods); enabling measurement of samples (cereals, foods, and chemical products) under various conditions (powder, particles, paste, and liquid).
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Product
High Current Probes (Power Electronics) H310
1001695
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The High Current Probes (Power electronics) H310 is meticulously engineered for precision in high-demand electronic applications. With a total length of 14.00 mm, this probe is designed to facilitate seamless connections in power electronics, showcasing its aptitude in efficient electrical measurements. The compact architecture, with a press ring diameter of 1.50 mm and an outer diameter of 1.20 mm, ensures a secure fit in various receptacles. The collar height of 0.30 mm contributes to its robustness, making it an essential tool for both power engineers and hobbyists alike.
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High Current Probes (Power Electronics) HCF77517B400G300
1005051
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The High Current Probes (Power Electronics) HCF77517B400G300, with an order code of 1005051, are specifically designed to handle challenging electrical environments. These basic contact probes not only ensure a reliable connection but also operate within a wide temperature range of -45°C to +200°C, making them suitable for various applications across the power electronics field. With a continuous current rating of 50 A and a typical contact resistance of just 5 mOhm, these probes guarantee high performance and efficiency, crucial for modern power testing setups.
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Product
High Current Probes (Power Electronics) HCF77506B400G300A
1091012
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The High Current Probes (Power Electronics) HCF77506B400G300A is designed for high-performance applications in power electronics, delivering excellent efficiency and reliability. With a robust configuration capable of handling continuous currents up to 50A, this probe can operate across a wide temperature range from -45°C to +200°C. The basic contact probe design ensures optimal performance with a low typical contact resistance of just 5 mOhm, making it suitable for demanding environments where precision is essential.
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Misc. Electronic Instruments
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Electronic components for test and measurement come in all sizes.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Product
Modular Logic Analysis
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With the HDA125 High-Speed Digital Analyzer, Teledyne LeCroy has defined a totally new class of instrument – a high-performance logic analyzer module that can be combined with existing high-speed oscilloscopes to provide unparalleled mixed-signal measurement and analysis.
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Failure Analysis
MicroINSPECT 300FA
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The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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Electronic Line Stretchers
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Simplify VCO measurements with controlled phase shifts from 180 to 1300 MHzOver 360° phase shift of the reflected signalNormalized and stable magnitude of the reflected signalVoltage controlled for automated applications
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Electronic Loads
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Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
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Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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Spectrum Analysis
S95090B
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The S95090B spectrum analyzer (SA) measurement software adds high-performance microwave spectrum analysis to PXI VNAs. With fast stepped-FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The S95090B software uses the PXI network analyzer's test and reference receivers to complete simultaneous spectrum measurements. Multi-channel SA measurements leverage the PXI VNA's internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The S95090B spectrum analyzer software application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy. Optional external attenuators should be connected with the VNA’s test ports to avoid receiver compression when measuring large signals.
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Product
Programmable Single Channel DC Electronic Load, 150V/30A/200W
T3EL150302P
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Programmable Single Channel DC Electronic Load, 150V/30A/200W.
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Product
Electronic Tire Tester
Model BTT-5700
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The Branick BTT-5700 was created from the ground up to be the most efficient, durable and reliable electronic tire tester available. The electronic detector accurately locates flaws that may be missed using conventional methods. A visible spark occurs at the site of a flaw and the rotation stops to allow the flaw to be marked. The adjustable height platform reduces physical strain that can often lead to workers compensation claims. The BTT-5700 also features a bi-directional variable speed electric rotation motor that is whisper quiet. The auto extend/retract ramp makes tire loading easy. Hand controls are located on a locking swing arm that can be adjusted in seconds. Four air tool ports and two electric outlets are also provided so any needed tools can be kept close for improved efficiency. A high power LED light and Medium Truck Probe are also included. All probe heads require only the push of a button to change and are available to fit all common tire sizes. And, like everything from Branick, it's made in the USA.
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Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Electronic Type Universal Testing Machines
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Our list of current Electronic Type Universal Testing Machines products are listed below. If you cannot find what you are looking for, please contact us and we will try our best to help you.
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Sustainability Analysis
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ETAP's Sustainability Analysis module estimates the carbon footprint of electrical networks by tracking electricity generation from sources and consumption across network elements, such as loads and distribution systems, over time. The tool utilizes region-specific, time-varying emission factors from a dataset covering 172 balancing authorities worldwide, providing critical insights to improve accessibility. Custom values can also be entered to ensure flexibility in regions where data is unavailable.
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DC Electronic Load
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DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
