Failure Analysis
examination of faults, determine root cause and recommend corrective actions.
See Also: Crush, Performance Testing, Investigation
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Product
Characterization Of VCSEL Arrays Including Polarization Analysis
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Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Product
CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Product
Vibration Analysis Software
VibroDesigner
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VibroDesigner software is used for data acquisition, storing and analyzing. Using this software with portable STD-500/510/3300 or stationary CTD3168/2160/2060 units helps to schedule machinery maintenance at a convenient time.
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Product
Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
Protocol Trigger And Decode Analysis Software
I3C
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Tektronix I3C Software runs on Tektronix DPO/MSO5000, DPO7000 and DPO/DSA/MSO70000 oscilloscope series. I3C Software uses the hardware based real-time I3C protocol aware trigger, protocol analysis of long acquisition record length up to 125MB to provide superior I3C Protocol Analysis result at the press of button.
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Product
Real-Time Broadcast Analysis
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Mediaproxy provides a comprehensive suite of software-based analysis applications to help you attend to on-air issues quickly and resolve them efficiently. Employing the latest user interface technologies, complex analysis tasks are made easy and seamless, including your mobile devices.
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Product
Data Acquisition & Analysis
FlowCam 5000
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Yokogawa Fluid Imaging Technologies, Inc.
FlowCam 5000 is our most affordable instrument. Streamlined for rapid data acquisition and analysis, it quickly and easily images, measures, analyzes, and counts microparticles suspended in a fluid medium.
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Product
Stress Analysis Strain Gages
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Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Product
Spectrum Analysis Up To And Beyond 125 GHz
S93094B
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The S93094B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency limit determined solely by the broadband or banded millimeter-wave frequency extenders used in the system.
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Product
Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide
N6785A
Source Measure Unit
The N6785A is a source/measure unit (SMU) designed specifically for battery drain analysis of large mobile, battery-powered devices up to 20 V, up to 8 A, up to 80 W.
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Product
Vibration Analysis Software For Squeak & Rattle Testing
MB BSR Suite
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MB BSR SUITE is the complete solution for all measurement tasks in the field of NVH, Squeak & Rattle and Sound Quality testing. Comprehensive analysis and assessment capabilities also enable the use of the BSR Suite for analysis and evaluation of functional and operating noise, vibrational effects on humans as well as the acoustic and haptic feedback of controls and actuators. Predefined test configurations for typical tasks such as multi-channel road load data acquisition, drive-file generation and objective Squeak & Rattle and Sound Quality testing allow for fast and simple operation. Signal statistics and user defined thresholds or reference-curves can be used for objective evaluation of different acoustic or haptic quality criteria. In addition the development and integration of application- or customer-specific analyses and evaluation methods is also possible at any time. Contact MB to find a solution for your measurement task!
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Product
Software Composition Analysis
SCA
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*Test Immediately in Your Development EnvironmentLaunch scans right from the command line for fast feedback in the pipeline and IDE. See and fix code errors earlier in the Software Development Life Cycle.*Reduce Fix Time From Hours to MinutesAuto-remediation capabilities prescribe intelligent fixes, generate auto-pull requests, and minimize disruption for higher accuracy and faster fix rates. *Automate Open-Source Policy and GovernanceEasily manage your open-source usage with continuous monitoring, extensive analytics, and flexible policies.
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Product
Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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Product
Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Product
*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Product
Stack Usage Analysis
StackAnalyzer
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AbsInt Angewandte Informatik GmbH
StackAnalyzer automatically determines the worst-case stack usage of the tasks in your application. The analysis results are shown as annotations in the call graph and control flow graph
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Product
Code Analysis
Kiuwan
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Identify code defects & vulnerabilitesto manage your remediation effortsBlazingly fast analysis in a collaborative and unlocalized environment.
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Product
Thermal Analysis
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Improve accuracy, sensitivity, and performance in thermal analysis using our comprehensive portfolio of instruments. Our wide selection of precision designed accessories and consumables deliver the peace of mind that comes from knowing that you’ll get the results you need.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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Time Domain Analysis
S93010A
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The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
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3/4D Image Visualization and Analysis Software
Imaris
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Our latest release, Imaris 8.4, introduces a new and innovative approach to tracing neuron structures in 3D images. Torch™, a patent-pending tool which intuitively highlights structures in close proximity to the cursor while darkening the rest of the image, enables users to efficiently and accurately trace individual neurons within dense and thick samples. Improved depth visibility makes tracing in thick samples easier than ever before, allowing for the selection of a dynamic region of interest for tracing. All of this possible with terabyte-sized datasets.
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Sample Analysis Services
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Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Product
Stack Gas Analysis System
ENDA-5000 series
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Continuous simultaneous and high-precision measurement of NOx, SO2, CO, CO2 and O2.HORIBA has over 100,000 CEM systems installed and 30 years of quality and experience. That is the base on which HORIBA's new ENDA-5000 series of stack-gas analysis systems are built. These systems have a small footprint and use cross-flow modulated non-dispersive infrared (NDIR) and magneto-pneumatic detectors that are inherently drift-free. The ENDA-5000 series are superior continuous analysis systems that perform reliably for difficult exhaust gas measurements, when measurement errors cannot be tolerated. This CEM series features a new intuitive touch panel that makes every operation available with the touch of a single button. The ENDA-5000 series systems are also designed for ease of maintenance. They are ideal for a variety of uses, including emissions monitoring from steam boilers, refuse incinerators, and electric power generation plants to assure pollution standards are being met.
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Green House Gas Analysis
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Gas chromatographs help analyze green house gases in air and soil. In addition to nitrous oxide, which is known by its high global warming potential, CO and CH4 are measured by a single analysis.
