System Integrators
incorporation of all integral elements, orchestrated.
See Also: System Integration, Systems, ATE Integrators
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
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The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Valve Leak Measurement System
VLMS
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The G Systems Valve Leak Measurement System (VLMS) reliably measures slow leaks that are unidentifiable with conventional leak detectors, helping manufacturers test and ensure that critical valves are absolutely airtight.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
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Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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HV Test System for Patient Monitors
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HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Onboard Systems
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Collect and store critical data securely to facilitate train operation monitoring, driver performance evaluation, and post-event investigation; reliable data management can yield improved operational efficiency and safety
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Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Systems
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In addition to our ISO 9001:2008 certification, we are proud to have the highest possible score for delivery-on-time and QA rating - 100% - from all the major aerospace companies.
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Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Data Acquisition and Control System
DAQ 7000
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data acquisition and control system that provides connectivity, signal conditioning and modular I/O for variety of sensors or signals, and it is an ideal DAQ for field deployment.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Mezzanine System
5047
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The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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IFEC Embedded System Hardware
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State-of-the-art system components serve as building blocks for you to create the ideal IFEC system.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
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The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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VIP IFEC & CMS Systems
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Astronics is the smart choice for inflight connectivity, entertainment, and cabin management solutions for VIP, VVIP, and business aircraft. From the highest-performing global SATCOM connectivity for optimum productivity and entertainment, to our Avenir IFE/CMS line that incorporates the latest technologies to deliver native 4K video distribution through the highest bandwidth Ethernet network system in the industry, Astronics is ready with a cutting-edge solution that delivers the ultimate VIP experience.
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Product
Multi-Functional Optical Profiling system
7505-01
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Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
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The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
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Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Battery Management (BMS) Environmental Test System
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The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Data Processing System
CRS-D8I-3VF1
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The CRS-D8I-3VF1 VPX system’s I/O flexibility is capable of meeting a large number of configurations. It is designed to support Abaco Systems’ Intel 3rd generation Core i7 3U SBCs, Gigabit Ethernet switch, video compression card, CUDA-based graphics cards and a MIL-STD-1553/ARINC429 multi-protocol card.
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LabVIEW Development Systems
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Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
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The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Other Test Systems
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Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
In-Circuit Tester
Sparrow MTS 30
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The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Integrated Thermal Control System
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The Vektrex Integrated Thermal Control System (ITCS) uses proprietary water-based thermal control to maintain consistent LED and laser device temperatures during high power testing applications. LED/VCSEL manufacturers and third-party test facilities standardize on ITCS chambers for their testing needs.
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Product
Omniblock Integrated X-Ray Systems
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Omniblock® X-ray generators from Excelitas Technologies integrate the high-voltage source and X-ray tube into one consolidated housing. This design configuration eliminates the high-voltage cables and connectors reducing cost while improving system design flexibility and streamlining integration. They are specifically designed for generating X-rays in static or rotating applications using proven designs of up to 180 kV and 2.4 kW. Typical applications for Omniblock X-ray generators include baggage screening, medical imaging, food inspection, industrial analysis and many other cost-sensitive and space-constrained X-ray applications.
