System Integrators
incorporation of all integral elements, orchestrated.
See Also: System Integration, Systems, ATE Integrators
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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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ICP Microphone System
378C10
This model includes a 1/4" microphone cartridge, a mated preamplifier with TEDS, and system calibration.
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Power System Simulator
F6150e
This power system simulator performs the simplest through the most complex tests. Meeting all your protective relay testing needs, the F6150e is available in different configurations.
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Measuring Systems For Beverage Can Manufacture
Tool Cleaning System
Optik Elektronik Gerätetechnik GmbH
High performance ultra-sonic device for long life operation. Special cleanser suitable for steel, stainless steel, glass, ceramic, rubber, plastic Removal of strong mineral residues (lime, silicates, phosphates…), grease etc. Customized table made with durable stainless steel. Stainless wire basket for easy handling included. Optional available: special tool inset for punch and ironing dies.
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Stack Gas Analysis System
ENDA-5000 series
Continuous simultaneous and high-precision measurement of NOx, SO2, CO, CO2 and O2.HORIBA has over 100,000 CEM systems installed and 30 years of quality and experience. That is the base on which HORIBA's new ENDA-5000 series of stack-gas analysis systems are built. These systems have a small footprint and use cross-flow modulated non-dispersive infrared (NDIR) and magneto-pneumatic detectors that are inherently drift-free. The ENDA-5000 series are superior continuous analysis systems that perform reliably for difficult exhaust gas measurements, when measurement errors cannot be tolerated. This CEM series features a new intuitive touch panel that makes every operation available with the touch of a single button. The ENDA-5000 series systems are also designed for ease of maintenance. They are ideal for a variety of uses, including emissions monitoring from steam boilers, refuse incinerators, and electric power generation plants to assure pollution standards are being met.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Omnisens Securing Power Cable Integrity
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In both underground and subsea cables incipient faults often result in temperature events. Using optical fibers integrated into the power cable or laid close by, Distributed Temperature Sensing (DTS) helps detect changes and faults allowing the operator to intervene before the cable fails. It is suitable for deployment in any cable where an optical fiber is present, including HVDC, HVAC, export, inter-array, transmission and distribution.
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Vehicle Management System
Vehicle Management Systems (VMS) are used to perform a multitude of functions on critical military platforms including manned and unmanned military aircraft, helicopters, shipboard vessels, autonomous missile systems and military ground vehicles, and function as the core control element within a redundant control system.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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System Information Gatherer
SIGAR API
Hyperic's System Information Gatherer (SIGAR) is a cross-platform API for collecting software inventory data. SIGAR is core of HQ's auto-discovery functionality, and you can use it to extend auto-discovery behavior.
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Microprocessor Development System
DS-M8
# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Measuring System
K-5201MA
To solve this problem, the following composition of the complex was chosen in the test stand conditions:laptop in a protected version PanasonicTBCF-53;measuring block - NIUSB-4431 with a set of vibroaccelerometers AP-2037;vibration excitation system LW 139.151-30 with mounting kit for the disk.The software of the complex provides the following functions:spectral analysis of vibration signals in the regulated range;search for natural excitation frequencies in given frequency ranges;Formation of database of existing disks;generation of reporting forms;and etc.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Integrated Provisioning System
Promptlink Communications, Inc.
Integrated Provisioning System (IPS) is a robust operational tool for use in active, dynamic provisioning of DOCSIS cable modems and PacketCable™ devices. Promptlink’s IPS application software supports common provisioning functions, such as dynamic IP address assignment using DHCP, domain name server configurations, and the generation and management of CM configuration files, plus Service and Subscriber Management.
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Mask Flatness Measurement System
Tropel® UltraFlatTM 200 Mask System
The Tropel® UltraFlatTM 200 Mask System was designed specifically for the photomask industry. It delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications. Shrinking device features require not only flatter wafers, but flatter masks.
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Automated Thermostat Test System
*Transport mechanism moves thermostats to various temperature controlled locations.*Continuously monitored process status*PC controlled transport and measurements*Operator is shielded from 200 - 210 degree F hot water insertion baths*LabVIEW® test/process language
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Benchtop Vision Measurement System
HVR-Flip
The HVR-Flip large field-of-vision (FOV) Benchtop Vision Measurement System has the unique characteristic of being used in either a vertical or horizontal format offering tremendous versatility and value. Rapidly measure parts up to 3.65 x 3"Working distance of 10". Measure a single feature, an entire part, or multiple parts. MetLogix™ M3 software allows for easy one-touch feature measurement. Auto-detect part recognition.
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Health and Usage Monitoring Systems
Honeywell Aerospace Technologies
Health and Usage Monitoring Systems (HUMS) for helicopters provide diagnostic information required for optimum performance. HUMS sensors and embedded diagnostic software monitor and communicate the health and maintenance needs of critical components.
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Test Automation Systems
iTest
Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Integrating Sphere Light Sources
Integrating sphere light sources with LED based or continuous broadband emission spectrum for use as luminance standards for camera calibration, for the determination of veiling glare, for the adjustment of night vision devices and much more. Diameters in the range from 50 mm to 500 mm with options like monitor detector, signal output control by manual and remote apertures and much more.
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Automated Optical Inspection System
506
We are proud to introduce the latest member of our model 505 AOI product family, the 506. This system was developed to provide a high coverage, easy to program AOI system for the larger backplanes / backpanels being produced today.
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Automatic Tablet Weighing System
CIW 7.2/7.3
With the automatic weighing system CIW 7.2 / 7.3 LAB you weigh tablets, dragees, capsules and similar products. Based on the UTS tablet testing systems by Kraemer Elektronik, the standard unit offers a tablet separation system and a special transport star for precise positioning of the test specimen on the integrated scale.The CIW 7.2 / 7.3 LAB in the laboratory version is now equipped with the database-driven, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application.The functionality of the software can be extended modularly – matching your needs and requirements.Alternatively, you can expand the CIW 7.2 / 7.3 LAB weighing system with a 12-station feeder and/or a 12-station collector to perform multiple defined tests (12-station feeder) in one measuring cycle. All cleaning-related parts can be easily and quickly disassembled without tools.The CIW 7.3 LAB model is nearly identical to the CIW 7.2 LAB, but additionally features a precise measuring device for thickness determination.
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Laser Interferometers & Calibration Systems
Keysight Technologies is a world leader in the design and manufacture of laser interferometry systems, advanced electronic measurement systems, high-precision optical components, complex monolithic optics (CMOs), and opto-electronic systems design for the most demanding metrology applications. Keysight systems offer high precision in a wide dynamic range, the ability to simultaneously measure a position with multiple degrees of freedom, and the highest accuracy available in both air and vacuum systems.
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Terahertz Systems
Optoelectronic Terahertz-Generation. TOPTICA provides complete systems and components for both time-domain and frequency-domain terahertz generation. For time-domain applications, the TeraFlash sets new standards in terms of dynamic range, bandwidth and measurement speed. Combining TOPTICA's FemtoFiber smart laser technology with state-of-the-art InGaAs antennas, the system achieves a peak dynamic range of more than 90 dB and a bandwidth greater than 5 THz.
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DAQ Systems
Data acquisition systems (DAQ or DAS) collect information from connected sensors and other instrumentation to measure and record electrical and physical quantities, such as voltage, current, temperature, strain, pressure, shock, vibration, distance, displacement, RPM, Angle, and weight. A DAQ System typically consists of sensors, measurement hardware with signal conditioning and an Analog-to-Digital converter, and a computer with programmable software for data logging and analysis.
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Conductivity-Resistivity Sensor Electronics and Integral System with PVDF Sensor
2850
The Signet 2850 Conductivity/Resistivity Sensor Electronics are available in various configurations for maximum installation flexibility. The universal mount version is for pipe, wall, or tank mounting and enables single or dual (digital versions only) inputs using any standard Signet Conductivity/Resistivity sensor. The threaded j-box version can be used with these same Signet sensors for submersible sensor mounting. It is also available as a combined integral system configuration for in-line mounting and includes a conductivity electrode in a choice of 0.01, 0.1, 1.0, 10.0 or 20.0 cm-1 cell constants. The 2850 is ideal for applications with a conductivity range of 0.055 to 400,000 S or a resistivity range of 18.2 M to 10 k.
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Automated Measurement System
EVG®40NT
The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography relevant parameters like critical dimension, as well as bond alignment accuracy.Because of the high-measurement accuracy, it is possible to verify compliance to tight process specifications and instantly optimize integrated process parameters.
