HenergySolar
A PV (photovoltaic) module and solar cell manufacturer.
- 008621-56185657
- 4006-048-365-607
- sales@henergysolar.com
- #16 GuangHua Road
TongZhou Industry Distric, Beijing
China
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product
Spectroscopic Ellipsometer
PH-SE
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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product
PV Measurements System
PH-IQE200
PV Measurements offers to combine a Spectral Response/QE/IPCE system with an I-V system into one compact measurement system. Depending upon the configuration required for your devices,it may share a test fixture.This reduces overall system cost.
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product
Wafer and Cells PL System
HS-PL
Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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product
Minority Carrier Life Time System
MWR-SIM
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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product
Large Range Resistivity Tester
HS-SFRT
HS-SFRT silicon filament resistivity tester is an advanced silicon cylinder resistivity tester, which can measure silicon filament, silicon phosphorus ingot, silicon boron ingot, seed crystal and so on. As it eliminates Peltier effect, Seebeck effect, minority carrier inject effect and so on, So it improve the accuracy greatly. The testing resistivity ranges from 0.0005Ω·cm to 50000Ω·cm. It is accurate, stable and convenient and a good friend to Siemens polysilicon material producer, SH4 polysilicon material producer, UMG polysilicon material producer and so on.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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product
Auto Spectroscopic Ellipsometer
PH-ASE
The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.
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product
Polysilicon Resistivity Tester
HS-POSRT
HS-POSRT polysilicon resistivity tester is an advanced resistivity tester, it has features of wide resistivity measuring range, high testing accuracy, high stability, swift body and easy operation. It is a good friend to Siemens polysilicon material producer,SH4 polysilicon material producer, UMG polysilicon material poroducer and so on
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product
olar Cells and Modules Online Measurement System
PV-LIT
The fully automatic PV-LIT testing system offers individual and serial testing options for solar cells and complete solar modules. The modular testing system allows easy integration into existing production lines and can be used in automated serial testing for quality assurance.
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product
Silicon O/C Content Tester
HS-OCT-6700
The HS-OCT-6700 system used to measure the O&C in silicon ingot and wafers. The system is the highest performance FT-IR systems available. While the spectrometer has the power to handle the most advanced research-level experiments, routine analyses are performed just as conveniently. Every facet of the Nicolet FT-IR spectrometer has been engineered to facilitate sample handling, introduce options to scientists, and increase laboratory throughput.
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product
Wafer Defect observing instrument
HS-WDI
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Silicon Phosphor and Boron Analyze system
HS-ICP-MS
The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
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product
Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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product
Semiconductor Large Range Type Tester
HS-PSTT
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
