Applied Test Resources
Applied Test Resources (ATR) was established in 1997, with the primary objective of providing advanced Analog Test software solutions for the semiconductor Industry. As ATR's business developed, we saw an increasing need in the industry for cost effective, user-friendly, specific advanced analog test hardware. ATR then redirected our focus to develop total test solutions at highly competitive prices. Our product to meet the demand for customized test solutions at lower test costs is the MTS-2010 Mixed Signal Test System.
- (610) 488-0802
- sales@atr-inc.org
- 3219 E. Camelback Rd.
Suite 201
Phoenix, AZ 85018
United States of America
Categories
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product
Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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product
High Voltage Power Source
PM2000
The PM2000 is a high voltage power source capable of supplying up to 2000 V and sourcing 10mA to a load. The high potential at 2 kV fulfills coverage for mostly all semiconductor devices where leakage and breakdown measurements are involved. The module has been incorporated with interlock feature to ensure safety.
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product
Floating Power FET moduleAmp Loop
PFM1010
The PFM1010 Module is a precision instrument capable of measuring all common DC parameters in a power MosFet as well as many of the AC parameters. This module uses some very innovative techniques to make it possible to measure parameters like Rdson down into the sub-million-ohm range.
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product
Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
