Scientific Computing International
Not a manufacturer of consumer goods, but rather a developer and provider of advanced metrology systems and analysis software.
- (760) 634-3822
- info@sci-soft.com
- 6355 Corte Del Abeto
Suite C-105
Carlsbad,, CA 92011
United States of America
-
Product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
-
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
-
Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
-
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
-
Product
Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
-
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
-
Product
Wafer Manufacturing
-
Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
-
Product
Flat Panel Display
-
Scientific Computing International
Is an electronic display used to display visual content such as text or images.
-
Product
Compound Semiconductor
-
Scientific Computing International
Semiconductors that are made from two or more elements.
-
Product
Benchtop Metrology System
FilmTek 2000 SE
-
Scientific Computing International
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings. Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and intuitive material modeling software to make even the most demanding of measurement tasks simple and reliable.
-
Product
Advanced Packaging & TSV
-
Scientific Computing International
System providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements.
-
Product
Data Storage
-
Scientific Computing International
Refers to magnetic, optical or mechanical media that records and preserves digital information for ongoing or future operations.
-
Product
Advanced Packaging & TSV
FilmTek 2000M TSV
-
Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
-
Product
LED
-
Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
-
Product
Semiconductor
-
Scientific Computing International
Materials which have a conductivity between conductors (generally metals) and nonconductors or insulators
-
Product
Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
-
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
-
Product
Photonics & Telecom
-
Scientific Computing International
photonic integrated circuit manufacturing delivers unmatched measurement accuracy.
-
Product
Thin Film Design Software
-
Scientific Computing International
SCI offers software tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry. SCI’s current standalone optical thin film software includes:
