Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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Siemens/RIT/Other Targets
Siemens/RIT/Other Targets by Applied Image - RIT Alphanumeric Chart, Siemens/Star Sector Target, Resolution 2-Cycle Long Test Chart, Sayce Target, Resolution Linear Test Chart, Ultra-High Resolution Target, Digital/Electronic Pixel Target
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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SINE Sinusoidal Vision Demonstration Array
The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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ACCUplace Land Pattern Kit
APKIT-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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FBI / MITRE Test Charts & Kits
FBI / MITRE Test Charts & Kits by Applied Image - FBI SIQT Scanner Test Chart, Individual Personal Identity Verification Test Charts for Single Fingerprint Capture Devices, Personal Identity Verification Kits for Single Fingerprint Devices
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Custom Barcodes
Verifier and scanner manufacturers often require custom barcodes for product evaluation, calibration, and quality control. Whether it’s a single code or a composite sheet of multiple codes, symbologies, minimum x dimension, etc., APPLIED IMAGE produces these custom, photo-composed standards to meet the needs of our global base of customers using our proprietary ACCUedge® technology.
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ACCUplace Dot Patterns
AP-D Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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SINE M-7 Sinusoidal Array
The Sinusoidal Array SINE M-7 has an image size of 22mm x 30mm which makes it small enough to fit into a standard 35mm projection frame. The gray scale is contained in the outer rows. It is made on 35mm perforated film.The TM-G variations are produced on a wider film (without perforations) and cemented between glass. They are available at each modulation (-35, -60, -80).
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Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Custom Test Targets & Charts
Our customers in industries that require camera or scanner image evaluation certainly know the challenges that come from finding the perfect target for a specific system and measurement. Thankfully, we at APPLIED IMAGE know these challenges just as well. The ability to freely customize a target has proved important for our customers to get the image evaluation tools they need. Our sales engineers are experts in different types of targets and specifications that will give you the best results for your project, and will guide you through the process from start to finish.
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Stage Micrometer Measuring Scales
The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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ACCUplace Dot Distortion Target
AP-DD Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Distortion target is designed to detect the presence of both barrel/pincushion distortion as well as alignment distortion that causes the keystone effect. The precise amount of distortion is determined from an array of precisely placed dots in a regular array. The results can be used to correct for any distortion that occurs within the optical system. The AP-DD is offered on three standard substrates; Chrome on Glass (CG) Opal (OP) and Photo Paper (RM).
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Test Targets & Charts
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
