Bruker Nano Surfaces
From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of AFMs, stylus profilers, mechanical testers, non-contact 3D optical microscopes, and fluorescence optical microscopes.
- 978-663-3660
- 978-663-5585
- pr@bruker.com
- 40 Manning Road
Billerica, MA 01821
United States of America
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Optical Emission Spectrometers
Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Fluorescence Multiphoton Microscopy
Ultima Investigator™
As the most streamlined model of Bruker''s Ultima family of multiphoton microscopes, Ultima Investigator™ features a base system specifically optimized for in vivo studies and is designed for add-on flexibility with a host of specialized options. Ultima Investigator''s high-resolution, high-speed, high-sensitivity deep imaging provides the ultimate value for smaller labs and additional imaging bandwidth in larger labs.
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Micro-XRF Spectrometers
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Nanomechanical Instruments for SEM/TEM
As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale.
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CS/ONH Analyzers
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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3D Optical Microscopy
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
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Tribometers & Mechanical Testers
Research into materials and how materials can be changed to influence strength, integrity, or durability is an integral part of product design and improvement across nearly every industry. Bruker's mechanical testers and tribometers provide the most comprehensive and versatile means of investigating tribology—friction, wear, load, hardness, and lubrication.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Tribology System
UMT TriboLab™
Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.
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CMP Process and Material Characterization System
CP-4
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.