Bruker microCT
Manufacture systems for microtomography, nontomography and non-invasive 3D X-ray microscopy.
- 32 3 877 5705
- 32 3 877 5769
- info.BmCT@bruker.com
- Kartuizersweg 3B
Kontich, 2550
Belgium
Categories
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Infrared, Near Infrared & Raman Spectroscopy
Our selection of near, mid and far infrared and Raman spectrometers is unrivalled across the industry. Our portfolio includes compact, portable routine as well as powerful research spectrometers. Our solutions cover the entire spectral range from near infrared, mid infrared, far infrared to THz applications.
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Semiconductor Solutions
Bruker's suite of technologies for semiconductor manufacturing address critical metrology and process needs across the broadest range of applications from R&D to process improvement. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products.
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Mechanical Tester
UMT TriboLab
Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.
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Mechanical Tester
TriboLab CMP
Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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CS/ONH Analyzers
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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CBRNE Detectors
Investments in intellectual horsepower, research and development; enable Bruker to offer a wide range of products with a broad technological base and high end instrumentation
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Portable XRF Spectrometers
Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Electron Microscope Analyzer
QUANTAX WDS
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Elemental Analyzers
Bruker manufactures instruments for elemental analysis from 100% down to the sub-ppb trace level. Easy-to-use solution packages help customers in process and quality control to meet industry norms and standards including ASTM, DIN, ISO and FDA. Highest analytical accuracy and precision enable academic research from lab to field.
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Micro-XRF Spectrometers
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Diffractometers & Scattering Systems
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.






















