Anfatec Instruments AG
Anfatec develops , produces & sells scientific instruments for surface science, mainly Scanning Probe Microscopes, controllers and components for SPM.
- +49 (0)37421 24212
- +49 (0)37421 24221
- mailbox@anfatec.de
- Melanchthonstr. 28
Oelsnitz (V), 08606
Germany
Categories
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Raman Spectrometer
Spec 64
The fiber coupled high speed Raman spectrometer is optimized for maximum light throughput and high speed spectrum acquisition. Connected to an AFM or a scanning stage, high speed Raman imaging is possible due to an integration time down to 10 ms per spectrum. The spectrometer can be operated with a separate software as stand-alone device or synchronized via the Anfatec AFM software.
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Digital Quad-channel High-Frequency Lock-In Amplifier -
eLockIn 205
Being the top model eLockIn series, the eLockIn205/2 offers a very fast TCP/IP connection, ultra-fast DAC outputs of the measured signals and all signals supplied at BNC connectors.
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High-Speed AFM
Is a type of atomic force microscopy (AFM) that, unlike conventional AFM, can take an image very quickly and with relatively low imaging force, therefore allowing for visualizing the dynamic behavior of biomolecules.
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The Level AFM For Educational Purposes
"Eddy"
„Eddy“ is an Atomic Force Microscopy system for student's education. It bases on the approved Level AFM setup and includes a full sample set and a large cantilever set.
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Ambient Single Point Kelvin Probe System
This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
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Anfatec's Humidity Sensor
Humi
Temperature sensor: operating range: -40 .. 123.8 °C resolution: 0.01 °CHumidity sensor: operating range: 0 .. 100 %RH (Relative Humidity) resolution: 0.05 %RHPressure sensor: operating range: 300 .. 1100 hpa resolution: 3 hpa user-friendly software
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The Golden STM
*Golden (chemically resistive) vibration isolated STM body with implemented preamplifier*Computer with PCI board based SPM controller *Anfatec Scan & Anfatec Present*19“ STM controller (extra low noise 24 bit converters)*HV display for z-direction*High voltage amplifiers for the x-y-tube scanning*Optional: PC controlled bi-potentiostat and electrochemical cell
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Kelvin Probe Systems
Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Digital Quad-Phase "DSP" Lock-In Amplifier -
eLockIn203
The eLockIn203 can be used as spectrum analyser, as oscilloscope, as sinus generator or as measurement control system.
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SPM Controller
the ability to provide independent torque (current) control or speed (voltage) control to the motor at any throttle position.
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Low-noise High-voltage Amplifier For Tube-scanners -
HV200/5
The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.
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High Speed Controllers
Anfatec's brand-new SPM controller development integrates cutting-edge D/A- and A/D-conversion technology into a unique state-of-the-art multiple DSP system.The digital real-time feedback loop provides an outstanding performance with ~1 µs latency in contact and dynamic mode. A synchronized digital scan generator with programmable output filtering guarantees an absolutely jitter free image. Intelligent data acquisition features allow to eliminate image non-linearities caused by the user's mechanical system.
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
