Advantest Corp.
Automated Testing Equipment (ATE) verify the quality, performance and reliability of semiconductors by electrically testing these complex and multifarious functions of semiconductors with high accuracy. The automated testing technologies from Advantest at the top of the industry are contributing to higher efficiency in production on customer sites, technological innovations of the electronics industry, and greater safety, security and comfort for society.
- +81-3-3214-7500
- +81-3-3214-7712
- webmaster@advantest.com
- Shin Marunouchi Center Bldg.
1-6-2, Marunouchi, Chiyoda-ku,
Tokyo, 100-0005
Japan
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product
Performance Board
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
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product
Wireless Data Logger
EVA100
The new highly integrated measurement system "EVA100" is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal / sensor / digital IC devices and Modules including Electronic Control Unit (ECU) for automotive evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.
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product
Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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product
TDR System
TS9001
The system accurately analyzes the wiring quality of various leading-edge semiconductor packages such as Flip Chip BGA, wafer level packages, and 2.5D/3D ICs using terahertz technology. It is a TDR analysis system that has the world’s top-class signal quality.
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product
Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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product
Test Handler
M4171
Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
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product
Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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product
Terahertz Spectroscopic System
TAS7400
The TAS7400 product line offers a series of low-cost, all-purpose spectroscopic systems that enable spectroscopic measurements using terahertz (THz) waves. The tools are capable of performing non-destructive analysis on a wide variety of sample types, making it applicable to a broad range of fields from life sciences to electronics, where precise chemical and material characterization is critical. The systems are ideal for settings ranging from basic research to product development, as well as for manufacturing and quality control, and employ easy-to-use spectroscopic methods that do not require specialized knowledge of THz wave generation or optics.
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product
Terahertz Spectroscopic Analysis System
TAS7500SU
Wideband spectroscopic analysis in the terahertz frequency range A newly developed Cherenkov terahertz source delivers dramatically improved high-frequency capabilities, supporting spectroscopic measurement up to 7THz Highly stable spectral power is ideal for terahertz research Supports measurement of pharmaceuticals in liquid, solid, and powder forms Easy module switching requires no adjustments Attached dry air unit eliminates moisture interference
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product
Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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product
Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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product
Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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product
Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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product
Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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product
Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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W2BI Inc.
W2BI envisages an optimized user experience of seamless communication between an array of wireless devices defined by adaptability, inclusivity and independence. We envision W2BI as being the global forerunner in shaping this interoperability within the automated wireless industry. A member of the Advantest Group
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Cloud Testing Service, Inc.
CloudTesting™ Service leverages recent advances in cloud computing that have transformed the concept of ownership from physical possession of an asset to a licensing agreement, with the asset itself residing in the cloud. Applying this paradigm to semiconductor test, we built a business model that expands customer access to testers by delivering test IP directly to their personal computers.
