UWE Electronics
Testing Technology and Temperature Management represent our core competence. That's where we implement successfully our most important philosophy: customer orientation
- 49 (0)89-441190-0
- 49 (0)89-441190-29
- info@uweelectronic.de
- Inselkammerstrasse 10
D 82008
Unterhaching, n/a n/a
Germany
Categories
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product
Test Fixtures
Test fixtures are a product for the test and the testing of printed circuit boards. The test adapters offered by uwe electronic are suitable for both manual testing and automated testing with vacuum operation. The test fixture can be either fully equipped and wired or delivered without installed components. Pneumatic, Mechanical and Vacuum Fixtures.
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MultiSite Test sockets and Wafer Level
multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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VG-Receiver
uwe electronic offers a wide variety of VG-Receiver for 4, 12 or 24 VG-Interface-Blocks. From bench-top test applications to complete rack and stack solutions, we provide a reliable and economical test based mass interconnect.
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Spring Contact Probes
We differentiated the spring contact probes by center and application, for the purpose of clarity. Please choose in the left navigation bar!
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Socket Probes
A lot of companies build test sockets. But only our test sockets are populated with our own proprietary probe technology, developed internally. This assures you that when you purchase one of our test sockets, you are using the most advanced interconnect available.
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Test Socket Lids
For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors
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Off-Set Kelvin Test Sockets
This is an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that's flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm.
