Teradyne, Inc.

Product

Asynchronous System Level Test Platform

Titan

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Teradyne, Inc.

Titan - Teradyne, Inc.

The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.

Product

TestStation Multi-Site Offline

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Teradyne, Inc.

Teradyne, Inc.

TestStation Multi-Site Offline provides true parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.

Product

Fastest In-Circuit Test Platform

TestStation

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Teradyne, Inc.

TestStation - Teradyne, Inc.

Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.

Product

Ultra-High Performance FLASH and DRAM Memories Test Solution

Magnum V

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Teradyne, Inc.

Magnum V - Teradyne, Inc.

Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.

Product

Test System

UltraFLEX

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Teradyne, Inc.

UltraFLEX - Teradyne, Inc.

The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.

Product

Portable, Integrated O-Level Test Platform

Guardian™

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Teradyne, Inc.

Guardian™ - Teradyne, Inc.

Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.

Product

Sustainment & Life-Cycle Support Solutions

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Teradyne, Inc.

Teradyne, Inc.

Managing long-term ATE effectiveness and sustainment involves more than just maintenance and repair.Total Support Solution combines Teradyne’s long-term product support, unmatched engineering expertise, and deep knowledge in defense logistics to provide support solutions specific to customer’s needs throughout the ATE life cycle, enabling customers from integration labs to factories and MRO shops to achieve optimized test solutions, maximum equipment uptime and minimum life-cycle costs.

Product

Smart Factory Solutions

Smart4Metrics Factory 4.0

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Teradyne, Inc.

Smart4Metrics Factory 4.0 - Teradyne, Inc.

Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.

Product

VXI Analog Instruments

Ai-762

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Teradyne, Inc.

Ai-762 - Teradyne, Inc.

Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.

Product

Lower-Cost Small Footprint In-Circuit Test System

TestStation LHS

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Teradyne, Inc.

TestStation LHS - Teradyne, Inc.

The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.

Product

Disk Drive Test System

Saturn

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Teradyne, Inc.

Saturn - Teradyne, Inc.

The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.

Product

Parallel Memory Test Solution

Magnum2

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Teradyne, Inc.

Magnum2 - Teradyne, Inc.

Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.

Product

Test System Optimized for High-Performance Digital and SoC

ULTRAWAVEMX44 and ULTRAWAVEMX20-D16

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Teradyne, Inc.

ULTRAWAVEMX44 and ULTRAWAVEMX20-D16 - Teradyne, Inc.

Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.

Product

5G Testing

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Teradyne, Inc.

Teradyne, Inc.

Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.

Product

TestStation Product Family

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Teradyne, Inc.

Teradyne, Inc.

TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.