Columbia Elektronik AB
COLUMBIA ELEKTRONIK AB is an expert organisation delivering complete test fixturing solutions to the Nordic electronics industry. Having pioneered the Swedish, Norwegian, Finnish and Danish markets back in 1977 we have today an absolute leadership in fixturing and test technology and enjoy a solid, major share of the market. We cover the whole spectra with testsystems, testfixtures, mass interconnect solutions and both hardware and software support and services. We design and produce both our own and vendor delivered testfixtures and mass interconnect solutions for functional and in-circuit test of electronic products and assemblies from component and PCB level to subassemblies and finished products. Columbia excels in all modern fixturing technologies – be it vacuum actuated, mechanical or pneumatic – applied to stand-alone, tester-integrated or inline fixtures.
- 46-11-398005
- info@columbia.se
- Sjöviksvägen 53
Kolmården, 61830
Sweden
-
product
RJ-50 Test Connector
Test solution for RJ-50 connectors (10 pole). Applications in data networks, data transmission, power supplies, microphones, etc.
-
product
High Current Probes
The maximum continuous current rating of a spring probe is determined by its design, size, and construction. Typical probes are rated from 2 to 8 amps maximum continuously current at working travel. While this is sufficient for most board test applications, higher current applications will require a much more solid and rugged probe to withstand current capabilities of 10 to 150 amps and beyond.Another high current solution is our feed-through plunger probe line. As the name already describes, the plunger moves right through the probe and is made from a single piece, reducing the internal resistance of the probe to a minimum.
-
product
Test Systems
Testing is more than just finding defects on Printed Circuit Boards. It is also about how to predict defects before they occur. A true economy can only be achieved when you see testing as an integrated part of manufacturing. To achieve this we provide Advanced Diagnostic Tools and Electronic Manufacturing Systems (EMS) that integrate testing with design, manufacturing, and repair.
-
product
Fiber-Optic Probes
Once your Universal Light Probe Sensor has been selected best for your test, the two-part solution is completed by selecting the suitable Fiber Optic Probe which is best for your application.Fiber Optic Probes come in a variety of different aperture sizes, lengths and cable types to suit your application.
-
product
USB-Mini Type B (With PCB Adapter And Socket) Test Connector
Test connector for Mini USB type B with PCB adapter and socket (5 pole) for contacting Mini USB Interfaces. Application in smaller Mini-USB devices like cameras, mobile phones, radios, hard disks etc. Comes in two versions.
-
product
Changeable Cassette
230350/1 – CMK-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
Test Connectors
The need for contacting standard USB or RJ connections and interfaces is increasing in the field of in-circuit and functional tests of PCBs because the standardization of these interfaces has great advantages.
-
product
Wire Harness/Automotive Probes
As a market leader, Feinmetall offers the largest product portfolio of application-specific contact probes and accessories for test module construction and wire harness testing. With innovative and economical solutions, we meet customer requirements and set trends in wire harness and automotive testing technology.
-
product
USB-Mini Type B (Extended) Test Connector
Test connector for Mini USB type B extended (5 pole) for contacting Mini USB Interfaces. Application in smaller Mini-USB devices like cameras, mobile phones, radios, hard disks etc. Comes in two versions.
-
product
Pilot H4 Next Manual
The Pilot H4 Next series manual represents the best solution for those looking for an economic flying probe system.
-
product
Manual Fixture Kit
230373 – CMCSK-04-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award-winning TestStation product family.
-
product
Manual Fixture Kit
230353 – CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
product
ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.

















