Sinton Instruments
Originally established in 1992 by Ron Sinton as Sinton Consulting, Sinton Instruments is dedicated to developing and applying new tools and analysis to R&D and manufacturing in silicon solar cells and integrated circuits. Our goal is to enable the routine use of state-of-the-art device physics and measurements.
- 1-303-945-2113
- techsupport@sintoninstruments.com
- 3200 Carbon Place
Suite 103
Boulder, CO 80301
United States of America
Categories
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product
Light I-V Testing for Modules
FMT-500
Advanced analysis of solar modules including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency modules.
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product
Light I-V Testing for Solar Cells
FCT-650
Advanced analysis of solar cells including light I-V and Suns-Voc data.
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product
Temperature Dependent Lifetime Measurement
WCT-120TS
Wafer lifetime measurement instrument Offering calibrated analysis of temperature-dependent carrier-recombination lifetime.
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product
The Standard R&D Wafer-Lifetime Tool
WCT-120
Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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product
Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Post-Diffusion Process Control
Suns-Voc MX
Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors
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product
In-Line Light I-V Testing for Solar Cells
FCT-750
In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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product
Measurement System
BLS-I/BCT-400
The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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product
Inline Wafer Testing
IL-800
Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
