Picoprobe
Line of microwave and oscilloscope probes, has served the on-wafer probing needs of the worldwide semiconductor industry, beginning with a line of high impedance troubleshooting probes for diagnostic studies of the internal workings of complex logic and memory chips.
- (239) 643-4400
- 239 643-4403
- email@ggb.com
- PO Box 10958
Naples, Fl 34101
United States of America
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Microwave Testing
220
The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Integrated Balun Probes
This is an example of a 900 MHz Integrated Balun Probe. It incorporates a 50 ohm unbalanced to 200 ohm balanced differential transformer. The probe can be built with or without a center tapped ground needle and may also incorporate DC bias through the differential pair or via separate needle contacts.
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Probe Cards
PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Microwave Testing
75
The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Microwave Testing
40A
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Differential Calibration Substrates
The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected.
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High Impedance Active Probes
12C
A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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Dual Microwave Probe
The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
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Microwave Testing
67A
A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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Multi-Contact Wedge
The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
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High Impedance Active Probes
34A
Engineered to meet the stringent demands of advanced high frequency circuit designers. This high impedance probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 megohm shunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input.
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Microwave Testing
1100B
The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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product
Microwave Testing
50
The MODEL 50 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 50 Picoprobe®, with or without the bias T option, achieves an insertion loss of less than 0.8 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
